Automatic Device Model Parameter Extractions via Hybrid Intelligent Methodology

2020 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) ◽

10.23919/sispad49475.2020.9241613 ◽

2020 ◽

Author(s):

Cheng-Che Liu ◽

Yiming Li ◽

Ya-Shu Yang ◽

Chieh-Yang Chen ◽

Min-Hui Chuang

Keyword(s):

Automatic Device ◽

Model Parameter ◽

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Identification of Correlated Device Model Parameter Values for Worst-Case Circuit Performance Analysis

The Fifth International Conference on VLSI Design ◽

10.1109/icvd.1992.658079 ◽

2005 ◽

Author(s):

A. Dharchoudhury ◽

S.M. Kang

Keyword(s):

Performance Analysis ◽

Circuit Performance ◽

Model Parameter ◽

Device Model ◽

Parameter Values

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GOPDE: global optimization in small signal device model parameter extraction

Proceedings of IEEE International Symposium on Circuits and Systems - ISCAS '94 ◽

10.1109/iscas.1994.408819 ◽

2002 ◽

Author(s):

Dongfeng Zhao ◽

R.R. Chen

Keyword(s):

Global Optimization ◽

Parameter Extraction ◽

Small Signal ◽

Model Parameter ◽

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Straightforward and accurate nonlinear device model parameter-estimation method based on vectorial large-signal measurements

IEEE Transactions on Microwave Theory and Techniques ◽

10.1109/tmtt.2002.803427 ◽

2002 ◽

Vol 50 (10) ◽

pp. 2315-2319 ◽

Author(s):

D.M.M.-P. Schreurs ◽

J. Verspecht ◽

S. Vandenberghe ◽

E. Vandamme

Keyword(s):

Parameter Estimation ◽

Estimation Method ◽

Large Signal ◽

Model Parameter ◽

Model Parameter Estimation ◽

Device Model ◽

Parameter Estimation Method

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Parasitic series resistance-independent method for device-model parameter extraction

IEE Proceedings - Circuits Devices and Systems ◽

10.1049/ip-cds:19960159 ◽

1996 ◽

Vol 143 (1) ◽

pp. 68 ◽

Author(s):

F.J. García Sánchez ◽

A. Ortiz–Conde ◽

J.J. Liou

Keyword(s):

Series Resistance ◽

Parameter Extraction ◽

Independent Method ◽

Model Parameter ◽

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RF GaN Device Model Survey and Model Parameter Extraction Flows

2020 IEEE 15th International Conference on Solid-State & Integrated Circuit Technology (ICSICT) ◽

10.1109/icsict49897.2020.9278132 ◽

2020 ◽

Author(s):

Raj Sodhi ◽

Roberto Tinti ◽

Mark Dunn ◽

Ma Long

Keyword(s):

Parameter Extraction ◽

Model Parameter ◽

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Improved objective function for device model parameter extraction

IEE Proceedings G Circuits Devices and Systems ◽

10.1049/ip-g-2.1992.0021 ◽

1992 ◽

Vol 139 (1) ◽

pp. 126

Author(s):

M.G. Middelhoek

Keyword(s):

Objective Function ◽

Parameter Extraction ◽

Model Parameter ◽

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ADMS-automatic device model synthesizer

Proceedings of the IEEE 2002 Custom Integrated Circuits Conference (Cat. No.02CH37285) ◽

10.1109/cicc.2002.1012760 ◽

2003 ◽

Author(s):

L. Lemaitre ◽

C. McAndrew ◽

S. Hamm

Keyword(s):

Automatic Device ◽

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Genetic Algorithm and Semiconductor Device Model Parameter Extraction

2009 Third International Conference on Genetic and Evolutionary Computing ◽

10.1109/wgec.2009.92 ◽

2009 ◽

Author(s):

Feng-bo Fang ◽

Tao Wu

Keyword(s):

Genetic Algorithm ◽

Semiconductor Device ◽

Parameter Extraction ◽

Model Parameter ◽

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Effects of Random Number Generations on Intelligent Semiconductor Device Model Parameter Extraction

10.1063/1.3117138 ◽

2009 ◽

Author(s):

Yiming Li ◽

George Maroulis ◽

Theodore E. Simos

Keyword(s):

Random Number ◽

Semiconductor Device ◽

Parameter Extraction ◽

Model Parameter ◽

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A Program for Device Model Parameter Extraction from Gate Capacitance and Current of Ultrathin$hboxSiO_2$and High-$kappa$Gate Stacks

IEEE Transactions on Electron Devices ◽

10.1109/ted.2006.880373 ◽

2006 ◽

Vol 53 (9) ◽

pp. 2118-2127 ◽

Author(s):

F. Li ◽

L.F. Register ◽

M.M. Hasan ◽

S.K. Banerjee

Keyword(s):

Parameter Extraction ◽

Gate Stacks ◽

Model Parameter ◽

Gate Capacitance ◽

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