High temperature operation of 760 nm vertical-cavity surface-emitting lasers investigated using photomodulated reflectance wafer measurements and temperature-dependent device studies
2005 ◽
Vol 152
(2)
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pp. 103
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2019 ◽
pp. 1-1
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2001 ◽
Vol 13
(7)
◽
pp. 645-647
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2018 ◽
Vol 36
(16)
◽
pp. 3332-3343
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Keyword(s):
Keyword(s):