Characterizing electrically active defects by transient capacitance spectroscopy
1984 ◽
Vol 143
(2-3)
◽
pp. L417-L420
◽
2004 ◽
Vol 43
(12)
◽
pp. 8026-8027
◽
1980 ◽
Vol 27
(12)
◽
pp. 2231-2239
◽
1980 ◽
Vol 17
(5)
◽
pp. 1041-1044
◽
Keyword(s):
Keyword(s):
Keyword(s):