Limits of accuracy in resistance measurement

1962 ◽  
Vol 109 (16) ◽  
pp. 299
Author(s):  
C.H. Miller
Author(s):  
Clifford Howard ◽  
Sam Subramanian ◽  
Kent Erington ◽  
Randall Mulder ◽  
Yuk Tsang ◽  
...  

Abstract Advanced technologies with higher gate leakage due to oxide tunneling current enable detection of high resistance faults to gate nodes using a straight forward resistance measurement.


2020 ◽  
Vol 67 (12) ◽  
pp. 5454-5459
Author(s):  
Xuan Li ◽  
Shiwei Feng ◽  
Chang Liu ◽  
Yamin Zhang ◽  
Kun Bai ◽  
...  

Author(s):  
Chun-Sheng Jiang ◽  
Dana.B. Sulas-Kern ◽  
Helio R. Moutinho ◽  
Dirk C. Jordan ◽  
Chuanxiao Xiao ◽  
...  

2019 ◽  
Vol 126 (24) ◽  
pp. 243904 ◽  
Author(s):  
Yanchao Liu ◽  
Zhenan Jiang ◽  
G. Sidorov ◽  
C. W. Bumby ◽  
R. A. Badcock ◽  
...  

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