HIGH DENSITY REFRACTIVE INDEX OF XENON

1984 ◽  
Vol 45 (C8) ◽  
pp. C8-53-C8-56 ◽  
Author(s):  
J. P. Itie ◽  
R. Le Toullec
2003 ◽  
Vol 42 (Part 1, No. 2B) ◽  
pp. 1101-1104 ◽  
Author(s):  
Masataka Shinoda ◽  
Kimihiro Saito ◽  
Takao Kondo ◽  
Tsutomu Ishimoto ◽  
Ariyoshi Nakaoki

Author(s):  
Tetsuya Mori ◽  
Kimio Moriya ◽  
Katsuma Kitazoe ◽  
Shotaro Takayama ◽  
Shinsuke Terada ◽  
...  

2009 ◽  
Vol 48 (3) ◽  
pp. 03A015 ◽  
Author(s):  
Tsutomu Ishimoto ◽  
Ariyoshi Nakaoki ◽  
Kimihiro Saito ◽  
Takeshi Yamasaki ◽  
Tomomi Yukumoto ◽  
...  

Author(s):  
Haseung Chung ◽  
Katsuo Kurabayashi ◽  
Suman Das

A near-field optical technique, using a new type of solid immersion lens (SIL), has been developed and applied to various areas, for example, high-density optical storage, near-field-scanning-optical-microscope probes, photolithography. Solid immersion microscopy offers a method for achieving resolution below the diffraction limit in air with significantly higher optical throughput by focusing light through a high refractive-index SIL held close to a sample [1]. The minimum resolution of a focusing system is inversely proportional to numerical aperture (NA), where NA = n sinθ, θ is the maximum angle of incidence, and n is the index of refraction at the focal point. Light with vacuum wavelength λ can be focused by an aberration-free lens to a spot whose full width at half maximum (FWHM) is λ/(2 NA) in the scalar diffraction limit, equivalent to Sparrow’s criterion for spatial resolution. In a medium of refractive index n, the effective wavelength is λeff = λ/n and corresponding effective numerical aperture is NAeff = n2sinθ. When a SIL is used, improvements in NAeff and spatial resolution are proportional to the refractive index of the SIL material. Fletcher et al. demonstrated imaging in the infrared with a microfabricated SIL [1, 2]. Baba et al. analyzed the aberrations and allowances for an aspheric error, a thickness error, and an air gap when using a hemispherical SIL for photoluminescence microscopy with submicron resolution beyond the diffraction limit [3]. Terris et al. developed and applied a SIL-based near-field optical technique for the writing and reading domains in a magneto-optic material [4]. Song et al. proposed the new concept of a SIL for high density optical recording using the near-field recording technology [5]. In this paper, we propose a sub-micron scale laser processing technique with spatial resolution beyond the diffraction limit in air using near-field optics. Our goal is to eventually develop a massively parallel nano-optical direct-write nano-manufacturing technique.


2012 ◽  
Vol 85 (5) ◽  
Author(s):  
Z. J. Simmons ◽  
N. A. Proite ◽  
J. Miles ◽  
D. E. Sikes ◽  
D. D. Yavuz

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