Combined field ion microscopy and transmission electron microscopy of heavy ion damage in tungsten

1990 ◽  
Vol 115 (1-3) ◽  
pp. 205-215
Author(s):  
Krystyna Stiller
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Heavy Ion ◽  
Field Ion Microscopy ◽  
Transmission Electron ◽  
Ion Damage ◽  
Ion Microscopy

The Creation and Annealing of Heavy Ion Damage in Silicon

1987 ◽  
Vol 93 ◽  
Author(s):  
L. M. Howe ◽  
M. H. Rainville
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Spatial Distribution ◽  
High Resolution ◽  
Heavy Ion ◽  
High Energy ◽  
Transmission Electron ◽  
Ion Damage ◽  
Deposited Energy ◽  
Microscopy Techniques

ABSTRACTHigh resolution transmission electron microscopy techniques have been used to obtain information on the contrast, spatial distribution, size and annealing behaviour of the damaged regions produced within individual collision cascades by heavy ion (As, Sb and Bi) bombardment (10–120 KeV) of silicon with 1.0 × 1011 – 6.0 × 1011 ions cm−2. The fraction of the theoretical cascade volume occupied by a heavily damaged region steadily increased as the average deposited energy density within the cascade increased. At high energy densities, the visible damage produced in the main cascade consisted of a single, isolated damaged region. With decreasing values of (i.e. increasing ion implant energies), there was an increasing tendency for multiple damaged regions to be produced within the main cascade.

scholarly journals Field Ion Microscopy of Tantalum-Carbon Alloys

1970 ◽  
Vol 28 ◽  
pp. 532-533
Author(s):  
P. Rao
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Thin Shell ◽  
Photographic Recording ◽  
General Morphology ◽  
Field Ion Microscopy ◽  
Bright Spots ◽  
Transmission Electron ◽  
Ion Microscopy ◽  
Carbon System

Transmission electron microscopy has proved the existence of interstitial order in the tantalum-carbon system and the structure has been suggested to be tetragonal of composition Ta64C. Detection of interstitial order using field ion microscopy is shown to be possible by observing the general morphology of the interstitial atoms appearing as bright spots at the tip surface. This is necessitated by the fact that photographic recording of stable images from interstitial solid solutions is difficult due to the inherent instability of interstitials present at and in a thin shell of undetermined thickness below the surface. However, interstitial ordering, if present, should be detectable by the appearance of regularly spaced rings of carbon atoms when both species (metal and interstitial) are continuously field evaporating.

Comparative Microstructures of Ion Milled and Electrochemically Thinned Composite Materials

1974 ◽  
Vol 32 ◽  
pp. 546-547
Author(s):  
R.R. Russell
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Composite Materials ◽  
Great Difficulty ◽  
Ion Milling ◽  
Transmission Electron ◽  
Ion Damage ◽  
Intermetallic Composite

Transmission electron microscopy of metallic/intermetallic composite materials is most challenging since the microscopist typically has great difficulty preparing specimens with uniform electron thin areas in adjacent phases. The application of ion milling for thinning foils from such materials has been quite effective. Although composite specimens prepared by ion milling have yielded much microstructural information, this technique has some inherent drawbacks such as the possible generation of ion damage near sample surfaces.

Multi-scale Investigation of Heterogeneous Swift Heavy Ion Tracks in Stannate Pyrochlore

2021 ◽  
Author(s):  
Eric O'Quinn ◽  
Cameron Tracy ◽  
William F. Cureton ◽  
Ritesh Sachan ◽  
Joerg C. Neuefeind ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Heavy Ion ◽  
X Ray Diffraction ◽  
X Ray ◽  
Structural Modifications ◽  
Multi Scale ◽  
Ion Tracks ◽  
Swift Heavy Ion ◽  
Transmission Electron

Er2Sn2O7 pyrochlore was irradiated with swift heavy Au ions (2.2 GeV), and the induced structural modifications were systematically examined using complementary characterization techniques including transmission electron microscopy (TEM), X-ray diffraction...

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