Combined electron microscopy and atom-probe field-ion microscopy

Ultramicroscopy ◽

10.1016/0304-3991(86)90129-4 ◽

1986 ◽

Vol 19 (4) ◽

pp. 401

Author(s):

Hans-Olof Andrén

Keyword(s):

Electron Microscopy ◽

Probe Field ◽

Field Ion Microscopy ◽

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Atom Probe Field Ion Microscopy and High Resolution Electron Microscopy: two complementary methods for atomic scale characterisation

2006 19th International Vacuum Nanoelectronics Conference ◽

10.1109/ivnc.2006.335304 ◽

2006 ◽

Author(s):

F. Danoix ◽

T. Gloriant ◽

T. Epicier ◽

F. Vurpillot ◽

W. Lefebvre

Keyword(s):

Electron Microscopy ◽

High Resolution ◽

High Resolution Electron Microscopy ◽

Atomic Scale ◽

Probe Field ◽

Field Ion Microscopy ◽

Complementary Methods ◽

Resolution Electron ◽

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A Microanalytical Study of Secondary Precipitation in RSR 143 Using Atom Probe Field Ion Microscopy and Analytical Transmission Electron Microscopy

10.7449/1984/superalloys_1984_631_636 ◽

1984 ◽

Author(s):

M.E. Twigg ◽

A.J. Melmed ◽

R. Klein ◽

M.J. Kaufman ◽

H.L. Fraser

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Analytical Transmission Electron Microscopy ◽

Probe Field ◽

Field Ion Microscopy ◽

Secondary Precipitation ◽

Transmission Electron ◽

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THE COMPLEMENTARY USE OF ATOM PROBE FIELD ION MICROSCOPY AND ANALYTICAL TRANSMISSION ELECTRON MICROSCOPY FOR THE STUDY OF A Ni-BASE SUPERALLOY

Le Journal de Physique Colloques ◽

10.1051/jphyscol:1984962 ◽

1984 ◽

Vol 45 (C9) ◽

pp. C9-373-C9-378 ◽

Author(s):

A. J. Melmed ◽

M. E. Twigg ◽

R. Klein ◽

M. J. Kaufman ◽

H. L. Fraser

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Analytical Transmission Electron Microscopy ◽

Probe Field ◽

Field Ion Microscopy ◽

Transmission Electron ◽

Ion Microscopy ◽

Base Superalloy

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A Comparative Study of B2 - DO3 Ordered Iron-Aluminium Alloys Using Atom Probe-Field Ion Microscopy and Transmission Electron Microscopy

International Journal of Materials Research (formerly Zeitschrift fuer Metallkunde) ◽

10.1515/ijmr-1987-780807 ◽

1987 ◽

Vol 78 (8) ◽

pp. 576-581

Author(s):

Hans-Jürgen Krause ◽

James Edward Wittig ◽

Georg Frommeyer

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Comparative Study ◽

Aluminium Alloys ◽

Probe Field ◽

Field Ion Microscopy ◽

Transmission Electron ◽

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AN ATOM PROBE FIELD ION MICROSCOPY STUDY OF DISLOCATION-SOLUTE INTERACTIONS NEAR TWIN BOUNDARIES IN WEB SILICON

Le Journal de Physique Colloques ◽

10.1051/jphyscol:1988685 ◽

1988 ◽

Vol 49 (C6) ◽

pp. C6-503-C6-507 ◽

Author(s):

R. JAYARAM ◽

J. A. SPITZNAGEL

Keyword(s):

Microscopy Study ◽

Twin Boundaries ◽

Probe Field ◽

Field Ion Microscopy ◽

Solute Interactions ◽

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Microstructural development in PWA-1480 electron beam welds — an atom probe field ion microscopy study

Applied Surface Science ◽

10.1016/0169-4332(95)00387-8 ◽

1996 ◽

Vol 94-95 ◽

pp. 280-287 ◽

Author(s):

S.S. Babu ◽

S.A. David ◽

M.K. Miller

Keyword(s):

Electron Beam ◽

Microscopy Study ◽

Microstructural Development ◽

Probe Field ◽

Field Ion Microscopy ◽

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Study on titanium carbide field emitters by field-ion microscopy, field-electron emission microscopy, auger electron spectroscopy, and atom-probe field-ion microscopy

Surface Science Letters ◽

10.1016/0167-2584(82)90422-4 ◽

1982 ◽

Vol 120 (1) ◽

pp. A329

Author(s):

M. Futamoto ◽

I. Yuito ◽

U. Kawabe ◽

O. Nishikawa ◽

Y. Tsunashima ◽

...

Keyword(s):

Titanium Carbide ◽

Electron Emission ◽

Electron Spectroscopy ◽

Auger Electron ◽

Probe Field ◽

Field Ion Microscopy ◽

Field Emitters ◽

Emission Microscopy ◽

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Chemical Homogeneity of NiPdP Metallic Glasses Studied by Atom Probe-Field Ion Microscopy / Feldionenmikroskop- und Atomsonden-Untersuchungen zur chemischen Homogenität metallener NiPdP-Gläser

International Journal of Materials Research (formerly Zeitschrift fuer Metallkunde) ◽

10.1515/ijmr-1989-800101 ◽

1989 ◽

Vol 80 (1) ◽

pp. 1-8

Author(s):

Michael Oehring

Keyword(s):

Metallic Glasses ◽

Probe Field ◽

Chemical Homogeneity ◽

Field Ion Microscopy ◽

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Atom-probe field ion microscopy

Microchimica Acta ◽

10.1007/bf01244464 ◽

1992 ◽

Vol 107 (3-6) ◽

pp. 95-104 ◽

Author(s):

Manfred Leisch

Keyword(s):

Probe Field ◽

Field Ion Microscopy ◽

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A controlled specimen preparation technique for interface studies with atom-probe field-ion microscopy

Journal of Physics E Scientific Instruments ◽

10.1088/0022-3735/16/7/014 ◽

1983 ◽

Vol 16 (7) ◽

pp. 617-619 ◽

Author(s):

A Henjered ◽

H Norden

Keyword(s):

Specimen Preparation ◽

Preparation Technique ◽

Probe Field ◽

Field Ion Microscopy ◽

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