CURVED SPACE MODEL FOR AMORPHOUS STRUCTURES AND ITS RELATION WITH DIFFRACTION EXPERIMENTS

Traditional oxide glasses occur naturally as obsidian and can be made easily by suitable cooling histories. In the past 30 years, a variety of techniques have been discovered which amorphize normally crystalline materials such as metals. These include [1-3]:Rapid quenching from the vapor phase.Rapid quenching from the liquid phase.Electrodeposition of certain alloys, e.g. Fe-P.Oxidation of crystals to produce amorphous surface oxide layers.Interdiffusion of two pure crystalline metals.Hydrogen-induced vitrification of an intermetal1ic.Mechanical alloying and ball-milling of intermetal lie compounds.Irradiation processes of all kinds using ions, electrons, neutrons, and fission products.We offer here some general comments on the use of TEM to study these materials and give some particular examples of such studies.Thin specimens can be prepared from bulk homogeneous materials in the usual way. Most often, however, amorphous materials are in the form of surface films or interfacial films with different chemistry from the substrates.

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Automated electron tomography: from data collection to image processing

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100136507 ◽

1995 ◽

Vol 53 ◽

pp. 26-27

Author(s):

Weiping Liu ◽

Jennifer Fung ◽

W.J. de Ruijter ◽

Hans Chen ◽

John W. Sedat ◽

...

Keyword(s):

Image Processing ◽

Data Collection ◽

Structural Information ◽

Imaging Technique ◽

Electron Tomography ◽

Ccd Camera ◽

Automated Data Collection ◽

Full Control ◽

Transmission Electron ◽

Amorphous Structures

Electron tomography is a technique where many projections of an object are collected from the transmission electron microscope (TEM), and are then used to reconstruct the object in its entirety, allowing internal structure to be viewed. As vital as is the 3-D structural information and with no other 3-D imaging technique to compete in its resolution range, electron tomography of amorphous structures has been exercised only sporadically over the last ten years. Its general lack of popularity can be attributed to the tediousness of the entire process starting from the data collection, image processing for reconstruction, and extending to the 3-D image analysis. We have been investing effort to automate all aspects of electron tomography. Our systems of data collection and tomographic image processing will be briefly described.To date, we have developed a second generation automated data collection system based on an SGI workstation (Fig. 1) (The previous version used a micro VAX). The computer takes full control of the microscope operations with its graphical menu driven environment. This is made possible by the direct digital recording of images using the CCD camera.

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Structural studies of small amorphous volumes by electron diffraction

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100173741 ◽

1990 ◽

Vol 48 (4) ◽

pp. 122-123

Author(s):

Pierre Moine

Keyword(s):

Electron Diffraction ◽

Born Approximation ◽

Structural Information ◽

Fundamental Relation ◽

X Rays ◽

Structural Studies ◽

Diffraction Experiment ◽

Transmission Electron ◽

Amorphous Structures ◽

Diffraction Patterns

Qualitatively, amorphous structures can be easily revealed and differentiated from crystalline phases by their Transmission Electron Microscopy (TEM) images and their diffraction patterns (fig.1 and 2) but, for quantitative structural information, electron diffraction pattern intensity analyses are necessary. The parameters describing the structure of an amorphous specimen have been introduced in the context of scattering experiments which have been, so far, the most used techniques to obtain structural information in the form of statistical averages. When only small amorphous volumes (< 1/μm in size or thickness) are available, the much higher scattering of electrons (compared to neutrons or x rays) makes, despite its drawbacks, electron diffraction extremely valuable and often the only feasible technique.In a diffraction experiment, the intensity IN (Q) of a radiation, elastically scattered by N atoms of a sample, is measured and related to the atomic structure, using the fundamental relation (Born approximation) : IN(Q) = |FT[U(r)]|.

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Positional Estimation Within a Latent Space Model for Networks

Methodology ◽

10.1027/1614-2241.2.1.24 ◽

2006 ◽

Vol 2 (1) ◽

pp. 24-33 ◽

Cited By ~ 17

Author(s):

Susan Shortreed ◽

Mark S. Handcock ◽

Peter Hoff

Keyword(s):

Random Effects ◽

Network Data ◽

Random Effects Models ◽

Space Model ◽

Network Analyses ◽

Recent Advances ◽

Latent Space ◽

Latent Space Model ◽

Modeling Data

Recent advances in latent space and related random effects models hold much promise for representing network data. The inherent dependency between ties in a network makes modeling data of this type difficult. In this article we consider a recently developed latent space model that is particularly appropriate for the visualization of networks. We suggest a new estimator of the latent positions and perform two network analyses, comparing four alternative estimators. We demonstrate a method of checking the validity of the positional estimates. These estimators are implemented via a package in the freeware statistical language R. The package allows researchers to efficiently fit the latent space model to data and to visualize the results.

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