Empirical relationship between the low‐frequency noise spectral density and the transconductance of silicon‐on‐insulatorn‐channel metal‐oxide‐semiconductor transistors
2000 ◽
Vol 40
(11)
◽
pp. 1897-1903
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2001 ◽
Vol 40
(Part 1, No. 12)
◽
pp. 6770-6777
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2006 ◽
Vol 45
(4B)
◽
pp. 3606-3608
◽
2010 ◽
Vol 49
(8)
◽
pp. 084201
◽
2001 ◽
Vol 40
(Part 1, No. 9A)
◽
pp. 5290-5293
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Keyword(s):
2011 ◽
Vol 50
(4)
◽
pp. 04DC01
◽
2011 ◽
Vol 50
(10S)
◽
pp. 10PB02
◽