Nondispersive x‐ray spectroscopy and imaging of plasmas using a charge−coupled device

A charge-coupled device (CCD) X-ray detector for inelastic X-ray scattering was installed at beamline BL-4C of the Photon Factory at the High Energy Accelerator Research Organization in Japan. A wavelength-dispersive X-ray spectrometer was mounted on a six-circle diffractometer. Energy spectra were obtained by the CCD X-ray detector and a curved highly oriented pyrolytic graphite analyser. By the combination of energy spectroscopy and diffraction, simultaneous real-time data acquisition of both the momentum and the energy transfer was performed.

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The direct X-ray detection with a charge coupled device.

The Review of Laser Engineering ◽

10.2184/lsj.18.11_923 ◽

1990 ◽

Vol 18 (11) ◽

pp. 923-930

Author(s):

Hiroshi TSUNEMI

Keyword(s):

Charge Coupled Device ◽

X Ray ◽

A Charge

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Use of a CCD-Based Area Detection System on a Fibre Diffractometer

Advances in X-ray Analysis ◽

10.1154/s0376030800018164 ◽

1994 ◽

Vol 38 ◽

pp. 503-510 ◽

Cited By ~ 1

Author(s):

S. Hanna ◽

A.H. Windle

Keyword(s):

Detection System ◽

Single Point ◽

Video Camera ◽

Reciprocal Space ◽

Charge Coupled Device ◽

X Ray ◽

Complete Section ◽

Ewald Sphere ◽

Pros And Cons ◽

A Charge

Abstract We describe a new X-ray fibre diffractometer, consisting of a commercial X-ray sensitive video camera coupled to a conventional 3-circle goniometer in place of a more traditional single-point detector. The active element of the video camera is a charge-coupled device (CCD). Diffraction images, obtained at various goniometer settings, are transformed into reciprocal space, and combined to give a complete section through the origin and parallel to the symmetry axis of cyiindrically averaged reciprocal space. A greater density of measurements is needed in the vicinity of the reciprocal fibre axis in order to avoid information loss due to the curvature of the Ewald sphere. The pros and cons of using CCD's as X-ray detectors are discussed and sample results from polymer fibres are shown.

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Using a charge-coupled device (CCD) to simultaneously gather x-ray fluorescence (XRF) and x-ray diffraction (XRD) information

10.1117/12.454227 ◽

2002 ◽

Author(s):

S. Cornaby ◽

T. D. Grow ◽

Arturo Reyes-Mena ◽

Paul W. Moody ◽

A. Stradling ◽

...

Keyword(s):

X Ray Diffraction ◽

Charge Coupled Device ◽

X Ray ◽

A Charge

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Chemical State Information of Bulk Specimens Obtained by SEM-Based Soft-X-Ray Emission Spectrometry

Microscopy and Microanalysis ◽

10.1017/s1431927614000439 ◽

2014 ◽

Vol 20 (3) ◽

pp. 692-697 ◽

Cited By ~ 19

Author(s):

Masami Terauchi ◽

Shogo Koshiya ◽

Futami Satoh ◽

Hideyuki Takahashi ◽

Nobuo Handa ◽

...

Keyword(s):

Electron Microscope ◽

Grazing Incidence ◽

Emission Spectrometry ◽

Charge Coupled Device ◽

X Ray ◽

Transmission Electron ◽

Line Spacing ◽

A Charge ◽

Electron Energy Loss ◽

Si Wafer

AbstractElectron-beam-induced soft-X-ray emission spectroscopy (SXES) that uses a grating spectrometer has been introduced to a conventional scanning electron microscope (SEM) for characterizing desired specimen areas of bulk materials. The spectrometer was designed as a grazing incidence flat-field optics by using aberration corrected (varied line spacing) gratings and a multichannel plate detector combined with a charge-coupled device camera, which has already been applied to a transmission electron microscope. The best resolution was confirmed as 0.13 eV at Mg L-emission (50 eV), which is comparable with that of recent dedicated electron energy-loss spectroscopy instruments. This SXES-SEM instrument presents density of states of simple metals of bulk Mg and Li. Apparent band-structure effects have been observed in Si L-emission of Si wafer, P L-emission of GaP wafer, and Al L-emissions of intermetallic compounds of AlCo, AlPd, Al2Pt, and Al2Au.

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