Beam divergence and ion density measurements for an induction coupled ion beam source

1992 ◽  
Vol 63 (11) ◽  
pp. 5234-5236
Author(s):  
J. R. Pai ◽  
N. Venkatramani
Keyword(s):  
Ion Beam ◽  
Beam Divergence ◽  
Beam Source ◽  
Ion Density ◽  
Density Measurements

Intense light ion beam divergence in single- and two-stage diodes

1993 ◽  
Vol 21 (5) ◽  
pp. 567-572 ◽  
Author(s):  
S. Miyamoto ◽  
K. Yasuike ◽  
N. Shirai ◽  
K. Imasaki ◽  
C. Yamanaka ◽  
...  
Keyword(s):  
Ion Beam ◽  
Beam Divergence ◽  
Two Stage ◽  
Intense Light

Ion beam divergence from unstable fluctuations in applied‐B diodes

1993 ◽  
Vol 5 (5) ◽  
pp. 1614-1624 ◽  
Author(s):  
R. N. Sudan ◽  
D. W. Longcope
Keyword(s):  
Ion Beam ◽  
Beam Divergence

An ultra-low energy (30–200 eV) ion-atomic beam source for ion-beam-assisted deposition in ultrahigh vacuum

2011 ◽  
Vol 82 (8) ◽  
pp. 083302 ◽  
Author(s):  
Jindřich Mach ◽  
Tomáš Šamořil ◽  
Stanislav Voborný ◽  
Miroslav Kolíbal ◽  
Jakub Zlámal ◽  
...  
Keyword(s):  
Atomic Beam ◽  
Ion Beam ◽  
Ultrahigh Vacuum ◽  
Low Energy ◽  
Beam Source ◽  
Atomic Beam Source ◽  
Ion Beam Assisted Deposition

Development of an intense pulsed metallic ion beam source

1988 ◽  
Vol 16 (4) ◽  
pp. 459-464 ◽  
Author(s):  
Y. Nakagawa ◽  
T. Ariyoshi
Keyword(s):  
Ion Beam ◽  
Beam Source

A slab‐shaped electron cyclotron resonance ion beam source for in‐line running target treatments

1996 ◽  
Vol 67 (3) ◽  
pp. 1000-1002 ◽  
Author(s):  
V. Roy ◽  
L. Wartski ◽  
F. Boukari ◽  
A. Momy ◽  
C. Schwebel ◽  
...  
Keyword(s):  
Cyclotron Resonance ◽  
Electron Cyclotron Resonance ◽  
Ion Beam ◽  
Electron Cyclotron ◽  
Beam Source

Metal cluster complex primary ion beam source for secondary ion mass spectrometry (SIMS)

Vacuum ◽  
2009 ◽  
Vol 84 (5) ◽  
pp. 544-549 ◽  
Author(s):  
Yukio Fujiwara ◽  
Kouji Watanabe ◽  
Hidehiko Nonaka ◽  
Naoaki Saito ◽  
Atsushi Suzuki ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Secondary Ion Mass Spectrometry ◽  
Metal Cluster ◽  
Ion Beam ◽  
Cluster Complex ◽  
Beam Source ◽  
Ion Mass Spectrometry ◽  
Secondary Ion

scholarly journals ECR as a ion beam source.

1990 ◽  
Vol 41 (9) ◽  
pp. 882-887
Author(s):  
Ken-ichi TAKAGI
Keyword(s):  
Ion Beam ◽  
Beam Source
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