Intense light ion beam divergence in single- and two-stage diodes

1993 ◽  
Vol 21 (5) ◽  
pp. 567-572 ◽  
Author(s):  
S. Miyamoto ◽  
K. Yasuike ◽  
N. Shirai ◽  
K. Imasaki ◽  
C. Yamanaka ◽  
...  
1975 ◽  
Vol 14 (7) ◽  
pp. 1029-1034 ◽  
Author(s):  
Tohru Sugawara ◽  
Yoshihiro Ohara
Keyword(s):  
Ion Beam ◽  

1993 ◽  
Vol 5 (5) ◽  
pp. 1614-1624 ◽  
Author(s):  
R. N. Sudan ◽  
D. W. Longcope
Keyword(s):  
Ion Beam ◽  

1993 ◽  
Vol 11 (2) ◽  
pp. 423-430 ◽  
Author(s):  
J.J. Ramirez ◽  
D.L. Cook ◽  
J.K. Rice ◽  
M.K. Matzen ◽  
D.L. Johnson ◽  
...  

Intense light-ion beams are being developed for investigations of inertial confinement fusion (ICF). This effort has concentrated on developing the Particle Beam Fusion Accelerator II (PBFA II) at Sandia as a driver for ICF target experiments, on design concepts for a high-yield, high-gain Laboratory Microfusion Facility (LMF), and on a comprehensive system study of a light-ion beam-driven commercial fusion reactor (LIBRA). This article reports on the status of design concepts and research in these areas.


1983 ◽  
Vol 22 (Part 2, No. 4) ◽  
pp. L219-L220 ◽  
Author(s):  
Hiroaki Aritome ◽  
Toshiya Yamato ◽  
Shinji Matsui ◽  
Susumu Namba

2018 ◽  
Vol 4 (3) ◽  
Author(s):  
Hu Chundong ◽  
Wu Mingshan ◽  
Xie Yahong ◽  
Wei Jianglong ◽  
Yu Ling

During the process of beam extraction in positive ion source under high voltage region, a large number of electrons are produced in the gaps of grids. After back-streaming acceleration, these electrons go back to arc chamber or impinge grids and then heat back plate or grids, which are harmful for the safety of ion source. Under the situation of poor beam extraction optics, a large part of the primary beam ions bombard the surface of suppressor grid (SG). And this process produces a large number of electrons. Due to the huge extracted voltage, the secondary electron emission coefficient of the SG surface is also high. As a result, the grids' current grows. According to the measurement of the current of SG and the calculation of the perveance of the corresponding shoot, the effect of ion beam divergence angle on back-streaming electrons can be analyzed. When the beam divergence angle increases, the number of back-streaming electrons increases rapidly, and grids' current changes significantly, especially the current of gradient grid and SG. The results can guide the parameters operating on the ion source for Experimental Advanced Superconducting Tokamak-neutral beam injection (EAST-NBI) and find the reasonable operation interval of perveance and to ensure the safety and stable running of the ion source, which has great significance on the development of long pulse, high power ion source.


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