Pulsed laser‐induced damage threshold studies of thin aluminum films on quartz: Simultaneous monitoring of optical and acoustic signals

1993 ◽  
Vol 64 (6) ◽  
pp. 1606-1610 ◽  
Author(s):  
Yau‐Ming Lai ◽  
Nai‐Ho Cheung
2017 ◽  
Vol 7 (1) ◽  
Author(s):  
Benoît Bussière ◽  
Nicolas Sanner ◽  
Marc Sentis ◽  
Olivier Utéza

1992 ◽  
Vol 31 (Part 1, No. 9A) ◽  
pp. 2762-2763 ◽  
Author(s):  
Shigeharu Tamura ◽  
Saburo Kimura ◽  
Yoshiyuki Sato ◽  
Hidetsugu Yoshida ◽  
Kunio Yoshida

2014 ◽  
Vol 2014 ◽  
pp. 1-7 ◽  
Author(s):  
L. Yang ◽  
X. D. Yuan ◽  
H. X. Deng ◽  
X. Xiang ◽  
W. G. Zheng ◽  
...  

The nanosecond (ns) and picosecond (ps) pulsed laser-induced damage behaviors of fused silica under cryogenic and room temperature have been investigated. The laser-induced damage threshold (LIDT) and damage probability are used to understand the damage behavior at different ambient temperatures. The results show that the LIDTs for both ns and ps slightly increased at cryogenic temperature compared to that at room temperature. Meanwhile, the damage probability has an inverse trend; that is, the damage probability at low temperature is smaller than that at room temperature. A theoretical model based on heated crystal lattice is well consistent with the experimental results.


1989 ◽  
Vol 7 (3) ◽  
pp. 433-441 ◽  
Author(s):  
Arthur H. Guenther ◽  
John K. McIver

Pulsed laser induced damage of optical thin films is, in general, initiated by the absorption of laser radiation by imperfections in the films or at interfaces between film layers and/or the substrate. A heat flow analysis of this process stresses the importance that the thermal conductivity of both the thin film host and that of the substrate play in establishing the laser-induced damage threshold. Unfortunately, recent work, which will be reviewed in this presentation, indicates that the thermal conductivity of thin films can be several orders of magnitude lower than that of the corresponding material in bulk form. This situation arises as a consequence of the film structure resulting principally from the deposition process. The importance of thermal conductivity will be compared to parameters such as absorption mechanisms, film materials, composition, and other variables. Its implication for the ultimate optical strength of materials and the direction in which thin film research and processing should proceed will be highlighted.


1972 ◽  
Vol 43 (9) ◽  
pp. 3789-3794 ◽  
Author(s):  
M. O. AboelFotoh ◽  
R. J. von Gutfeld

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