Nanometer‐scale field‐induced oxidation of Si(111):H by a conducting‐probe scanning force microscope: Doping dependence and kinetics
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1996 ◽
Vol 14
(2)
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pp. 1268
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2009 ◽
Vol 21
(1)
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pp. 015103
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2004 ◽
Vol 177-178
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pp. 537-544
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