Compact scanning-force microscope using a laser diode

Optics Letters ◽

10.1364/ol.13.001057 ◽

1988 ◽

Vol 13 (12) ◽

pp. 1057 ◽

Author(s):

Dror Sarid ◽

L. Stephen Bell ◽

Doug Iams ◽

Volker Weissenberger

Keyword(s):

Laser Diode ◽

Scanning Force Microscope ◽

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Performance of a scanning force microscope using a laser diode

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ◽

10.1116/1.576400 ◽

1990 ◽

Vol 8 (1) ◽

pp. 378-382 ◽

Author(s):

Dror Sarid ◽

Douglas A. Iams ◽

Jeffery T. Ingle ◽

Volker Weissenberger ◽

Josef Ploetz

Keyword(s):

Laser Diode ◽

Scanning Force Microscope ◽

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Laser-Diode Based Scanning Force Microscope and Ultrafast Sampling Probe

Ultrafast Electronics and Optoelectronics ◽

10.1364/ueo.1995.jwa3 ◽

1995 ◽

Author(s):

John Nees ◽

Douglas Craig ◽

Soichi Hama ◽

Shin ichi Wakana

Keyword(s):

Laser Diode ◽

Scanning Force Microscope ◽

Sampling Probe ◽

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Measurement of nanohardness and nanoelasticity of thin gold films with scanning force microscope

Applied Physics Letters ◽

10.1063/1.126976 ◽

2000 ◽

Vol 77 (3) ◽

pp. 361-363 ◽

Author(s):

B. Kracke ◽

B. Damaschke

Keyword(s):

Scanning Force Microscope ◽

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Towards quantitative determination of the spring constant of a scanning force microscope cantilever with a microelectromechanical nano-force actuator

Measurement Science and Technology ◽

10.1088/0957-0233/21/1/015103 ◽

2009 ◽

Vol 21 (1) ◽

pp. 015103 ◽

Author(s):

Sai Gao ◽

Zhikai Zhang ◽

Yong Wu ◽

Konrad Herrmann

Keyword(s):

Quantitative Determination ◽

Spring Constant ◽

Scanning Force Microscope ◽

Scanning Force ◽

Force Microscope Cantilever

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Nanoindentation combined with scanning force microscope for characterization of mechanical properties of carbon nitride thin films

Surface and Coatings Technology ◽

10.1016/s0257-8972(03)00924-1 ◽

2004 ◽

Vol 177-178 ◽

pp. 537-544 ◽

Author(s):

S. Chowdhury ◽

M.T. Laugier ◽

I.Z. Rahman ◽

M. Serantoni

Keyword(s):

Mechanical Properties ◽

Carbon Nitride ◽

Scanning Force Microscope ◽

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Nanometer‐scale field‐induced oxidation of Si(111):H by a conducting‐probe scanning force microscope: Doping dependence and kinetics

Applied Physics Letters ◽

10.1063/1.114861 ◽

1995 ◽

Vol 67 (21) ◽

pp. 3144-3146 ◽

Author(s):

T. Teuschler ◽

K. Mahr ◽

S. Miyazaki ◽

M. Hundhausen ◽

L. Ley

Keyword(s):

Nanometer Scale ◽

Scanning Force Microscope ◽

Doping Dependence ◽

Scale Field ◽

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Sample Holders for Imaging Intact Particles with the Scanning Force Microscope

Atomic Force Microscopy/Scanning Tunneling Microscopy ◽

10.1007/978-1-4757-9322-2_33 ◽

1994 ◽

pp. 327-338 ◽

Author(s):

A. A. Garcia ◽

M. Edwards

Keyword(s):

Scanning Force Microscope ◽

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Surface structures and energy gap of YBa2Cu3Oy/PrBa2Cu3Oy superlattices and YBa2Cu3Oy thin films probed with a scanning tunneling microscope and a scanning force microscope

Physica C Superconductivity ◽

10.1016/0921-4534(95)00590-0 ◽

1995 ◽

Vol 255 (1-2) ◽

pp. 30-36 ◽

Author(s):

Y. Chen ◽

L.M. Wang ◽

H.C. Yang ◽

H.E. Horng ◽

H.H. Sung

Keyword(s):

Scanning Tunneling Microscope ◽

Surface Structures ◽

Scanning Tunneling ◽

Scanning Force Microscope ◽

Tunneling Microscope ◽

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Evaluation of an epitaxial layer structure by lateral force and contact current measurements in a scanning force microscope

Microelectronic Engineering ◽

10.1016/0167-9317(94)90059-0 ◽

1994 ◽

Vol 24 (1-4) ◽

pp. 99-106 ◽

Author(s):

M. Maywald ◽

R.E. Stephan ◽

L.J. Balk

Keyword(s):

Epitaxial Layer ◽

Layer Structure ◽

Lateral Force ◽

Scanning Force Microscope ◽

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Fiber interferometer-based variable temperature scanning force microscope

Review of Scientific Instruments ◽

10.1063/1.1147992 ◽

1997 ◽

Vol 68 (4) ◽

pp. 1776-1778 ◽

Author(s):

R. Euler ◽

U. Memmert ◽

U. Hartmann

Keyword(s):

Variable Temperature ◽

Scanning Force Microscope ◽

Scanning Force ◽

Temperature Scanning

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