Epitaxial growth of CrO2 thin films by chemical-vapor deposition from a Cr8O21 precursor

2001 ◽  
Vol 89 (2) ◽  
pp. 1035-1040 ◽  
Author(s):  
P. G. Ivanov ◽  
S. M. Watts ◽  
D. M. Lind
1993 ◽  
Vol 63 (3) ◽  
pp. 331-333 ◽  
Author(s):  
Alex A. Wernberg ◽  
Gabriel Braunstein ◽  
Gustavo Paz‐Pujalt ◽  
Henry J. Gysling ◽  
Thomas N. Blanton

1995 ◽  
Vol 66 (21) ◽  
pp. 2801-2803 ◽  
Author(s):  
D. L. Kaiser ◽  
M. D. Vaudin ◽  
L. D. Rotter ◽  
Z. L. Wang ◽  
J. P. Cline ◽  
...  

2007 ◽  
Vol 989 ◽  
Author(s):  
Mahdi Farrokh Baroughi ◽  
Hassan G. El-Gohary ◽  
Cherry Y. Cheng ◽  
Siva Sivoththaman

AbstractHighly conductive epiraxial silicon thin films, with conductivities more than 680 ¥Ø-1cm-1, were obtained using plasma enhanced chemical vapor deposition (PECVD) technique at 300¢ªC. The effect of hydrogen in growth of low temperature extrinsic Si thin films was studied using conductivity, Hall, and Raman measurements, and it was shown that epitaxial growth was possible at hydrogen dilution (HD) ratios more than 85%. The epitaxial growth of the extrinsic Si thin films at high hydrogen dilution regime was confirmed by high resolution transmission electron microscopy (HRTEM).


2004 ◽  
Vol 43 (12) ◽  
pp. 8195-8198 ◽  
Author(s):  
Makoto Iwai ◽  
Makoto Ohmori ◽  
Takashi Yoshino ◽  
Shoichiro Yamaguchi ◽  
Minoru Imaeda

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