Minority carrier lifetime degradation in boron-doped Czochralski silicon

2001 ◽  
Vol 90 (5) ◽  
pp. 2397-2404 ◽  
Author(s):  
S. W. Glunz ◽  
S. Rein ◽  
J. Y. Lee ◽  
W. Warta
Author(s):  
Abigail Rose Meyer ◽  
Craig P Taylor ◽  
Michael Venuti ◽  
Serena Eley ◽  
Vincenzo LaSalvia ◽  
...  

Boron-doped Czochralski (Cz) Si is the most commonly used semiconductor in the fabrication of solar cells. The minority carrier lifetime in boron-doped Cz Si decreases upon light exposure due to...


2019 ◽  
Vol 33 (11) ◽  
pp. 121-132 ◽  
Author(s):  
John D. Murphy ◽  
Karsten Bothe ◽  
Massimiliano Olmo ◽  
Vladimir V. Voronkov ◽  
Robert J. Falster

2009 ◽  
Vol 106 (1) ◽  
pp. 013721 ◽  
Author(s):  
Mukannan Arivanandhan ◽  
Raira Gotoh ◽  
Kozo Fujiwara ◽  
Satoshi Uda

2008 ◽  
Vol 25 (2) ◽  
pp. 651-653
Author(s):  
Zhu Xin ◽  
Yang De-Ren ◽  
Li Ming ◽  
Chen Tao ◽  
Wang Lei ◽  
...  

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