Application of the Ion Bombardment Cleaning Method to Titanium, Germanium, Silicon, and Nickel as Determined by Low‐Energy Electron Diffraction

1958 ◽  
Vol 29 (8) ◽  
pp. 1150-1161 ◽  
Author(s):  
H. E. Farnsworth ◽  
R. E. Schlier ◽  
T. H. George ◽  
R. M. Burger
2014 ◽  
Vol 59 (6) ◽  
pp. 612-621 ◽  
Author(s):  
P.V. Galiy ◽  
◽  
Ya.B. Losovyj ◽  
T.M. Nenchuk ◽  
I.R. Yarovets’ ◽  
...  

2000 ◽  
Vol 458 (1-3) ◽  
pp. 155-161 ◽  
Author(s):  
S Walter ◽  
V Blum ◽  
L Hammer ◽  
S Müller ◽  
K Heinz ◽  
...  

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