A two-crystal spectrometer for chemical state analysis by high-resolution x-ray fluorescence spectrometry employs hall-screw and slide mechanisms rather than gears to obtain a 2θ scanning range of 40° -147°; a Δ2θ scanning step of 10−4 deg under vacuus; a 2θ resolution of 10−4 deg in determination of an intercrystal angle with encoder-based measurement; and servomechanical control of position. The spectrometer, although simple in structure, is a powerful instrument for chemical state analysis, as demonstrated by its high resolution, precision, and stability; as demonstrated in the determination of the Kα1 lines of first transition metals with Si(220) as analyzer crystal, and in its application to a systematic study of the chemical effects on Ni Kα1 and Kα2.
Superconducting High-Resolution X-Ray Spectrometers For Chemical State Analysis Of Dilute Samples
