HIGH RESOLUTION PIXE USING CRYSTAL SPECTROMETER COMBINED WITH POSITION SENSITIVE DETECTORS

1996 ◽  
Vol 06 (01n02) ◽  
pp. 97-116 ◽  
Author(s):  
KUNIKO MAEDA ◽  
HIROMI HAMANAKA ◽  
KEN-ICHI HASEGAWA
Keyword(s):  
High Resolution ◽  
Elemental Analysis ◽  
Chemical State ◽  
Crystal Spectrometer ◽  
X Ray ◽  
Position Sensitive ◽  
Position Sensitive Detectors ◽  
State Analysis

We describe characteristics of high-resolution, wavelength-dispersive crystal spectrometers equipped with a different type of position sensitive X-ray detectors: PSPC, CCD, IP and MCP. Utilities of these position sensitive spectrometers in PIXE experiments are demonstrated by referring several recent topics of elemental analysis, chemical state analysis and a study on sample charging.

Chemical State Analysis using a Gearless Two-Crystal X-Ray Spectrometer

1991 ◽  
Vol 35 (A) ◽  
pp. 393-399
Author(s):  
Tokuzo Konishi ◽  
Kazuo Nishihagi ◽  
Kazuo Taniguchi
Keyword(s):  
High Resolution ◽  
Systematic Study ◽  
Chemical State ◽  
Crystal Spectrometer ◽  
X Ray ◽  
Analyzer Crystal ◽  
Chemical Effects ◽  
Scanning Range ◽  
State Analysis

A two-crystal spectrometer for chemical state analysis by high-resolution x-ray fluorescence spectrometry employs hall-screw and slide mechanisms rather than gears to obtain a 2θ scanning range of 40° -147°; a Δ2θ scanning step of 10−4 deg under vacuus; a 2θ resolution of 10−4 deg in determination of an intercrystal angle with encoder-based measurement; and servomechanical control of position. The spectrometer, although simple in structure, is a powerful instrument for chemical state analysis, as demonstrated by its high resolution, precision, and stability; as demonstrated in the determination of the Kα1 lines of first transition metals with Si(220) as analyzer crystal, and in its application to a systematic study of the chemical effects on Ni Kα1 and Kα2.

HIGH RESOLUTION SOFT X-RAY SPECTROMETER FOR CHEMICAL STATE ANALYSIS BY PIXE

1992 ◽  
Vol 02 (01) ◽  
pp. 19-32 ◽  
Author(s):  
K. MAEDA ◽  
Y. SASA ◽  
M. UDA
Keyword(s):  
Chemical State ◽  
X Rays ◽  
Crystal Spectrometer ◽  
Electron Multiplier ◽  
X Ray ◽  
Chemical Effects ◽  
Photodiode Array ◽  
Position Sensitive ◽  
Ion Impact ◽  
State Analysis

A soft X-ray crystal spectrometer designed for chemical state analysis by PIXE is described. A windowless, microchannel plate (MCP) electron multiplier combined with a photodiode array was used as a position-sensitive detector for X-rays diffracted by a plane crystal. The spectrometer was tested for Al Kα and Fe L X-ray spectra induced by 15 MeV N2+ ion impact. An energy resolution (FWHM) of 1.5 eV for the 1487 eV Al Kα1, 2 line was obtained for metallic Al, and satellite structures of Al Kα arising from multiply ionized states were well resolved. Fe L X-ray spectra were measured for Fe2O3 and metallic Fe. Chemical effects were clearly recognized in the Fe Lα/Lβ intensity ratio and in the intensity distributions of their multiple vacancy satellites.

Chemical state analysis of vanadium by high resolution X-ray spectroscopy

1975 ◽  
Vol 4 (3) ◽  
pp. 117-118 ◽  
Author(s):  
Y. Gohshi ◽  
T. Nakamura ◽  
M. Yoshimura
Keyword(s):  
High Resolution ◽  
Chemical State ◽  
X Ray ◽  
State Analysis

scholarly journals Improving the energy resolution of bent crystal X-ray spectrometers with position-sensitive detectors

2014 ◽  
Vol 21 (4) ◽  
pp. 762-767 ◽  
Author(s):  
Ari-Pekka Honkanen ◽  
Roberto Verbeni ◽  
Laura Simonelli ◽  
Marco Moretti Sala ◽  
Ali Al-Zein ◽  
...  
Keyword(s):  
High Resolution ◽  
Internal Stress ◽  
Photon Energy ◽  
Energy Resolution ◽  
Preceding Paper ◽  
X Ray ◽  
Bent Crystal ◽  
Position Sensitive ◽  
Position Sensitive Detectors ◽  
Bent Crystals

Wavelength-dispersive high-resolution X-ray spectrometers often employ elastically bent crystals for the wavelength analysis. In a preceding paper [Honkanenet al.(2014).J. Synchrotron Rad.21, 104–110] a theory for quantifying the internal stress of a macroscopically large spherically curved analyser crystal was presented. Here the theory is applied to compensate for the corresponding decrease of the energy resolution. The technique is demonstrated with a Johann-type spectrometer using a spherically bent Si(660) analyser in near-backscattering geometry, where an improvement in the energy resolution from 1.0 eV down to 0.5 eV at 9.7 keV incident photon energy was observed.

Rapid chemical state analysis in air by highly sensitive high-resolution PIXE using a v. Hamos crystal spectrometer

2005 ◽  
Vol 34 (4) ◽  
pp. 389-392 ◽  
Author(s):  
Kuniko Maeda ◽  
Kenichi Hasegawa ◽  
Masaru Maeda ◽  
Kiyoshi Ogiwara ◽  
Hiromi Hamanaka
Keyword(s):  
High Resolution ◽  
Chemical State ◽  
Crystal Spectrometer ◽  
Highly Sensitive ◽  
State Analysis

MICRO WDX-PIXE SYSTEM AND ITS APPLICATION TO CHEMICAL STATE ANALYSIS

1999 ◽  
Vol 09 (03n04) ◽  
pp. 103-109 ◽  
Author(s):  
Y. MOKUNO ◽  
Y. HORINO ◽  
M. TERASAWA ◽  
T. SEKIOKA ◽  
A. KINOMURA ◽  
...  
Keyword(s):  
Small Area ◽  
Heavy Ion ◽  
Chemical State ◽  
X Rays ◽  
Position Resolution ◽  
X Ray ◽  
Position Sensitive ◽  
System Energy ◽  
Compound Materials ◽  
State Analysis

Performance of a micro WDX-PIXE system that consists of position sensitive x-ray spectrometer and the heavy ion microbeam line is described. The influence of the position resolution of the position sensitive proportional counter (PSPC) used in the spectrometer on system energy resolution is discussed based on the measured values for C and O K x-rays. The system has successfully been used for chemical state analysis of various compound materials and small area of the materials (< 3 × 10-3 mm 2) can be analyzed.

CHEMICAL STATE ANALYSIS OF Cr AND Fe BY IN-AIR PIXE USING A CURVED CRYSTAL SPECTROMETER COMBINED WITH A POSITION-SENSITIVE PROPORTIONAL COUNTER

2005 ◽  
Vol 15 (01n02) ◽  
pp. 1-9
Author(s):  
KUNIKO MAEDA ◽  
KENICHI HASEGAWA ◽  
HIROMI HAMANAKA ◽  
KIYOSHI OGIWARA ◽  
MASAMICHI TSUJI ◽  
...  
Keyword(s):  
Proportional Counter ◽  
Atmospheric Pressure ◽  
Chemical State ◽  
Transition Elements ◽  
Measuring Time ◽  
Crystal Spectrometer ◽  
Chemical States ◽  
Position Sensitive ◽  
Fine Structures ◽  
State Analysis

The feasibility of RIKEN high-resolution PIXE system for direct chemical state analysis of 3d transition elements was examined. K β spectra of Cr and Fe from several compounds were measured in air at atmospheric pressure using a crystal spectrometer consisting of a position-sensitive proportional counter and a curved crystal in v. Hamos geometry. Fine structures which reflect the chemical states of Cr and Fe were well recognized with the measuring time of tens minutes.

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