Electrical and microstructural characterization of molybdenum tungsten electrodes using a combinatorial thin film sputtering technique

2005 ◽  
Vol 97 (5) ◽  
pp. 054906 ◽  
Author(s):  
Seung-Ik Jun ◽  
Philip D. Rack ◽  
Timothy E. McKnight ◽  
Anatoli V. Melechko ◽  
Michael L. Simpson
Keyword(s):  
Thin Film ◽  
Microstructural Characterization ◽  
Tungsten Electrodes

Compositional and microstructural characterization of thin film lead zirconate titanate ferroelectrics

1990 ◽  
Vol 193-194 ◽  
pp. 1017-1022 ◽  
Author(s):  
Maria Huffman ◽  
J.P Goral ◽  
M.M Al-Jassim ◽  
A.R Mason ◽  
K.M Jones
Keyword(s):  
Thin Film ◽  
Lead Zirconate Titanate ◽  
Microstructural Characterization ◽  
Lead Zirconate ◽  
Zirconate Titanate

Synthesis and Characterization of Carbon Nitride Thin Film with Evidence of Nanodomes

2004 ◽  
Vol 843 ◽  
Author(s):  
S. Chowdhury ◽  
M. T. Laugier
Keyword(s):  
Thin Film ◽  
Deposition Temperature ◽  
Carbon Nitride ◽  
Room Temperature ◽  
Electrical Characterization ◽  
Microstructural Characterization ◽  
Rf Magnetron Sputtering ◽  
Synthesis And Characterization ◽  
Sputtering System

ABSTRACTWe have reported the synthesis of carbon nitride thin films with evidence of formation of carbon nanodomes over a range of substrate temperature from 50 °C to 550 °C. An RF magnetron sputtering system was used for depositing carbon nitride films. The size of the nanodomes can be controlled by deposition temperature and increases from 40–80 nm at room temperature to 200–400 nm at high temperature (550 °C). Microstructural characterization was performed by AFM. Electrical characterization shows that these films have conductive behaviour with a resistivity depending on the size of the nanodomes. Resistivity values of 20 mΩ-cm were found for nanodomes of size 40–80 nm falling to 6 m?-cm for nanodomes of size 200–400 nm. Nanoindentation results show that the hardness and Young's modulus of these films are in the range from 9–22 GPa and 100–168 GPa respectively and these values decrease as the size of the nanodomes increases. GXRD results confirm that a crystalline graphitic carbon nitride structure has formed.

Need for Standardization of EBSD Measurements for Microstructural Characterization of Thin Film Structures

2007 ◽  
Author(s):  
Roy H. Geiss ◽  
David T. Read ◽  
David G. Seiler ◽  
Alain C. Diebold ◽  
Robert McDonald ◽  
...  
Keyword(s):  
Thin Film ◽  
Microstructural Characterization

scholarly journals Microstructural characterization of a thin film ZrN diffusion barrier in an As-fabricated U–7Mo/Al matrix dispersion fuel plate

2015 ◽  
Vol 458 ◽  
pp. 406-418 ◽  
Author(s):  
Dennis D. Keiser ◽  
Emmanuel Perez ◽  
Tom Wiencek ◽  
Ann Leenaers ◽  
Sven Van den Berghe
Keyword(s):  
Thin Film ◽  
Diffusion Barrier ◽  
Microstructural Characterization ◽  
Dispersion Fuel ◽  
Al Matrix

3-Dimensional microstructural characterization of CdTe absorber layers from CdTe/CdS thin film solar cells

2016 ◽  
Vol 151 ◽  
pp. 66-80 ◽  
Author(s):  
Guillaume Stechmann ◽  
Stefan Zaefferer ◽  
Peter Konijnenberg ◽  
Dierk Raabe ◽  
Christina Gretener ◽  
...  
Keyword(s):  
Thin Film ◽  
Solar Cells ◽  
Microstructural Characterization ◽  
Thin Film Solar Cells ◽  
3 Dimensional ◽  
Cds Thin Film

scholarly journals Microstructural Characterization of CdTe and CIGS Thin Film Solar Cells by Analytical Transmission Electron Microscopy

2009 ◽  
Vol 15 (S2) ◽  
pp. 148-149
Author(s):  
U Sharma ◽  
D Susnitzky
Keyword(s):  
Thin Film ◽  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Solar Cells ◽  
Microstructural Characterization ◽  
Thin Film Solar Cells ◽  
Analytical Transmission Electron Microscopy ◽  
Transmission Electron ◽  
Cigs Thin Film

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

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