Combined electron and focused ion beam system for improvement of secondary ion yield in secondary ion mass spectrometry instrument

2006 ◽  
Vol 89 (16) ◽  
pp. 164103 ◽  
Author(s):  
L. Ji ◽  
Q. Ji ◽  
K.-N. Leung ◽  
R. A. Gough
Keyword(s):  
Mass Spectrometry ◽  
Focused Ion Beam ◽  
Secondary Ion Mass Spectrometry ◽  
Ion Beam ◽  
Mass Spectrometry Instrument ◽  
Beam System ◽  
Ion Mass Spectrometry ◽  
Secondary Ion

A C60Primary Ion Beam System for Time of Flight Secondary Ion Mass Spectrometry:  Its Development and Secondary Ion Yield Characteristics

2003 ◽  
Vol 75 (7) ◽  
pp. 1754-1764 ◽  
Author(s):  
Daniel Weibel ◽  
Steve Wong ◽  
Nicholas Lockyer ◽  
Paul Blenkinsopp ◽  
Rowland Hill ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Secondary Ion Mass Spectrometry ◽  
Ion Beam ◽  
Time Of Flight ◽  
Beam System ◽  
Ion Mass Spectrometry ◽  
Secondary Ion

Behavior of Gallium Secondary Ion Intensity in Gallium Focused Ion Beam Secondary Ion Mass Spectrometry

1997 ◽  
Vol 36 (Part 1, No. 3A) ◽  
pp. 1287-1291 ◽  
Author(s):  
Tetsuo Sakamoto ◽  
Masanori Owari ◽  
Yoshimasa Nihei
Keyword(s):  
Mass Spectrometry ◽  
Focused Ion Beam ◽  
Secondary Ion Mass Spectrometry ◽  
Ion Beam ◽  
Ion Mass Spectrometry ◽  
Secondary Ion

scholarly journals Combined focused ion beam and secondary ion mass spectrometry for high resolution light element detection applied on Li-Ion batteries

2021 ◽  
Vol 27 (S1) ◽  
pp. 1012-1015
Author(s):  
Gudrun Wilhelm ◽  
Ute Golla-Schindler ◽  
Katharina Wöhrl ◽  
Christian Geisbauer ◽  
Graham Cooke ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
High Resolution ◽  
Focused Ion Beam ◽  
Secondary Ion Mass Spectrometry ◽  
Ion Beam ◽  
Light Element ◽  
Li Ion Batteries ◽  
Ion Mass Spectrometry ◽  
Li Ion ◽  
Secondary Ion
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