The Impact of Ultra Thin ALD TiN Metal Gate on Low Frequency Noise of CMOS Transistors

2007 ◽  
Author(s):  
A. Mercha ◽  
R. Singanamalla ◽  
V. Subramanian ◽  
E. Simoen ◽  
W. Sansen ◽  
...  
Keyword(s):  
Low Frequency ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Metal Gate ◽  
Cmos Transistors ◽  
Tin Metal ◽  
The Impact

Low-frequency noise and static analysis of the impact of the TiN metal gate thicknesses on n- and p-channel MuGFETs

2010 ◽  
Vol 54 (12) ◽  
pp. 1592-1597 ◽  
Author(s):  
M. Rodrigues ◽  
J.A. Martino ◽  
A. Mercha ◽  
N. Collaert ◽  
E. Simoen ◽  
...  
Keyword(s):  
Static Analysis ◽  
Low Frequency ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Metal Gate ◽  
Tin Metal ◽  
The Impact

Low-Frequency Noise Investigation and Noise Variability Analysis in High- $k$/Metal Gate 32-nm CMOS Transistors

2011 ◽  
Vol 58 (8) ◽  
pp. 2310-2316 ◽  
Author(s):  
Diana Lopez ◽  
S. Haendler ◽  
C. Leyris ◽  
Gregory Bidal ◽  
Gérard Ghibaudo
Keyword(s):  
Low Frequency ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Metal Gate ◽  
Variability Analysis ◽  
Cmos Transistors ◽  
High K

On the Oxide Trap Density and Profiles of 1-nm EOT Metal-Gate Last CMOS Transistors Assessed by Low-Frequency Noise

2013 ◽  
Vol 60 (11) ◽  
pp. 3849-3855 ◽  
Author(s):  
Eddy Simoen ◽  
Anabela Veloso ◽  
Yuichi Higuchi ◽  
Naoto Horiguchi ◽  
Cor Claeys
Keyword(s):  
Low Frequency ◽  
Trap Density ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Metal Gate ◽  
Cmos Transistors ◽  
Oxide Trap

TaN Versus TiN Metal Gate Input/Output pMOSFETs: A Low-Frequency Noise Perspective

2018 ◽  
Vol 65 (9) ◽  
pp. 3676-3681 ◽  
Author(s):  
Eddy Simoen ◽  
Barry O'sullivan ◽  
Romain Ritzenthaler ◽  
Eugenio Dentoni Litta ◽  
Tom Schram ◽  
...  
Keyword(s):  
Low Frequency ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Input Output ◽  
Metal Gate ◽  
Tin Metal ◽  
Gate Input

Ceiling Construction Low-Frequency Noise Issues

2013 ◽  
Vol 649 ◽  
pp. 277-280
Author(s):  
Petra Berková ◽  
Pavel Berka
Keyword(s):  
Spectral Analysis ◽  
Low Frequency ◽  
Sound Insulation ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Frequency Tone ◽  
The Impact ◽  
40 Hz

Through the use of a spectral analysis of the source of noise – person’s movement over the ceiling construction – it was found out that in this kind of noise distinctive low-frequency tone components occur (31,5 - 40 Hz) which is beyond the evaluation area of the impact sound insulation of the ceiling construction, s. [2], [3].

Investigation of low-frequency noise of 28-nm technology process of high-k/metal gate p-MOSFETs with fluorine incorporation

2016 ◽  
Vol 115 ◽  
pp. 7-11
Author(s):  
Tsung-Hsien Kao ◽  
Shoou-Jinn Chang ◽  
Yean-Kuen Fang ◽  
Po-Chin Huang ◽  
Bo-Chin Wang ◽  
...  
Keyword(s):  
Low Frequency ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Metal Gate ◽  
High K ◽  
Technology Process ◽  
28 Nm

Improving Low-Frequency Noise in 14-nm FinFET by Optimized High-k/Metal Gate Thermal Processing

2021 ◽  
pp. 1-1
Author(s):  
Hao Zhu ◽  
Bin Ye ◽  
Chengkang Tang ◽  
Xianghui Li ◽  
Qingqing Sun ◽  
...  
Keyword(s):  
Thermal Processing ◽  
Low Frequency ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Metal Gate ◽  
High K

Low Frequency Noise (1/f ) Improvements on CMOS Transistors with a Single nmm+ Doped Poly Si-SiGe Gate Stack

2009 ◽  
Author(s):  
H. G. Jiménez ◽  
L. T. Manera ◽  
R. Wada ◽  
J. A. Diniz ◽  
I. Doi ◽  
...  
Keyword(s):  
Low Frequency ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Gate Stack ◽  
Cmos Transistors
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