Experimental Understanding of the Impact of Channel Percolation on Low Frequency Noise Using Transient Enhanced Diffusion of Channel Dopants

2021 ◽  
Author(s):  
Shuntaro Fujii ◽  
Soichi Morita ◽  
Tsutomu Miyazaki
Keyword(s):  
Low Frequency ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Enhanced Diffusion ◽  
Transient Enhanced Diffusion ◽  
The Impact

Ceiling Construction Low-Frequency Noise Issues

2013 ◽  
Vol 649 ◽  
pp. 277-280
Author(s):  
Petra Berková ◽  
Pavel Berka
Keyword(s):  
Spectral Analysis ◽  
Low Frequency ◽  
Sound Insulation ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Frequency Tone ◽  
The Impact ◽  
40 Hz

Through the use of a spectral analysis of the source of noise – person’s movement over the ceiling construction – it was found out that in this kind of noise distinctive low-frequency tone components occur (31,5 - 40 Hz) which is beyond the evaluation area of the impact sound insulation of the ceiling construction, s. [2], [3].

Low-frequency noise and static analysis of the impact of the TiN metal gate thicknesses on n- and p-channel MuGFETs

2010 ◽  
Vol 54 (12) ◽  
pp. 1592-1597 ◽  
Author(s):  
M. Rodrigues ◽  
J.A. Martino ◽  
A. Mercha ◽  
N. Collaert ◽  
E. Simoen ◽  
...  
Keyword(s):  
Static Analysis ◽  
Low Frequency ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Metal Gate ◽  
Tin Metal ◽  
The Impact

Low Frequency Noise Analysis in Advanced CMOS Devices

2011 ◽  
Vol 324 ◽  
pp. 441-444 ◽  
Author(s):  
Jalal Jomaah ◽  
Majida Fadlallah ◽  
Gerard Ghibaudo
Keyword(s):  
Experimental Data ◽  
Noise Analysis ◽  
Low Frequency ◽  
Deep Submicron ◽  
Electrical Noise ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Noise Sources ◽  
The Impact ◽  
Mobility Fluctuations

A review of recent results concerning the low frequency noise in modern CMOS devices is given. The approaches such as the carrier number and the Hooge mobility fluctuations used for the analysis of the noise sources are illustrated through experimental data obtained on advanced CMOS generations. Furthermore, the impact on the electrical noise of the shrinking of CMOS devices in the deep submicron range is also shown.

Experiments with the Stutter-Aid

1973 ◽  
Vol 36 (3_suppl) ◽  
pp. 1129-1130 ◽  
Author(s):  
William D. Trotter ◽  
Franklin H. Silverman
Keyword(s):  
Low Frequency ◽  
Noise Generator ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
The Impact

4 studies concerned with the impact of a miniature low-frequency noise generator (Stutter-Aid) on stuttering are summarized.

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