2021 5th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)
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243

(FIVE YEARS 243)

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9781728181769

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Fan-Out Wafer and Panel Level Packaging - A Platform for 3D Integration

2021 5th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) ◽

10.1109/edtm50988.2021.9420895 ◽

2021 ◽

Author(s):

Tania Braun ◽

Karl-Friedrich Becker ◽

Michael Topper ◽

Rolf Aschenbrenner ◽

Martin Schneider-Ramelow

Keyword(s):

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Design Limits of In-Memory Computing: Beyond the Crossbar

2021 5th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) ◽

10.1109/edtm50988.2021.9421057 ◽

2021 ◽

Author(s):

Gokul Krishnan ◽

Jubin Hazra ◽

Maximilian Liehr ◽

Xiaocong Du ◽

Karsten Beckmann ◽

...

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Technology Trends in 2.5D/3D Packaging and Heterogeneous Integration

2021 5th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) ◽

10.1109/edtm50988.2021.9421033 ◽

2021 ◽

Author(s):

Masaya Kawano

Keyword(s):

Heterogeneous Integration ◽

3D Packaging ◽

Technology Trends

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UV-assisted High-sensitivity Room-temperature Pd-gated HEMT NO2Gas Sensor

2021 5th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) ◽

10.1109/edtm50988.2021.9420958 ◽

2021 ◽

Author(s):

Chong Xing ◽

Dongcheng Xie ◽

Haochen Zhang ◽

Kang Song ◽

Lei Yang ◽

...

Keyword(s):

Room Temperature ◽

High Sensitivity

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Applications for Machine Learning in Semiconductor Manufacturing

2021 5th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) ◽

10.1109/edtm50988.2021.9421052 ◽

2021 ◽

Author(s):

Richard Burch ◽

Luke Merrick ◽

Qing Zhu ◽

Tomonori Honda ◽

Jeff David

Keyword(s):

Machine Learning ◽

Semiconductor Manufacturing

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Experimental Understanding of the Impact of Channel Percolation on Low Frequency Noise Using Transient Enhanced Diffusion of Channel Dopants

2021 5th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) ◽

10.1109/edtm50988.2021.9421039 ◽

2021 ◽

Author(s):

Shuntaro Fujii ◽

Soichi Morita ◽

Tsutomu Miyazaki

Keyword(s):

Low Frequency ◽

Frequency Noise ◽

Low Frequency Noise ◽

Enhanced Diffusion ◽

Transient Enhanced Diffusion ◽

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Phonon properties of group IV materials for thermoelectric applications

2021 5th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) ◽

10.1109/edtm50988.2021.9420883 ◽

2021 ◽

Author(s):

Atsushi Ogura ◽

Ryo Yokogawa

Keyword(s):

Group Iv ◽

Phonon Properties

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Impact of Non-Idealities in RRAMs on Hardware Spiking Neural Networks

2021 5th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) ◽

10.1109/edtm50988.2021.9420991 ◽

2021 ◽

Author(s):

Tejas Ketkar ◽

Shubham Sahay

Keyword(s):

Neural Networks ◽

Spiking Neural Networks

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All 2D Heterostructure Tunnel Field Effect Transistors

2021 5th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) ◽

10.1109/edtm50988.2021.9421001 ◽

2021 ◽

Author(s):

Kosuke Nagashio

Keyword(s):

Field Effect ◽

Field Effect Transistors

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Self-adaptive Matrix Equation Solving in Analog Memory Array 1

2021 5th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) ◽

10.1109/edtm50988.2021.9421027 ◽

2021 ◽

Author(s):

Jiancong Li ◽

Houji Zhou ◽

Yi Li ◽

Xiangshui Miao

Keyword(s):

Matrix Equation ◽

Memory Array ◽

Equation Solving ◽

Analog Memory ◽

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