Simultaneous real-time x-ray diffraction spectroscopy, Rutherford backscattering spectrometry, and sheet resistance measurements to study thin film growth kinetics by Kissinger plots

2008 ◽  
Vol 104 (10) ◽  
pp. 103538 ◽  
Author(s):  
D. Smeets ◽  
J. Demeulemeester ◽  
D. Deduytsche ◽  
C. Detavernier ◽  
C. M. Comrie ◽  
...  
Keyword(s):  
Thin Film ◽  
Real Time ◽  
Sheet Resistance ◽  
Growth Kinetics ◽  
Film Growth ◽  
Rutherford Backscattering Spectrometry ◽  
Rutherford Backscattering ◽  
Thin Film Growth ◽  
X Ray Diffraction ◽  
X Ray

Combinatorial (Ba,Sr)TiO3 thin film growth: X-ray diffraction and Raman spectroscopy

2009 ◽  
Vol 106 (3) ◽  
pp. 034108 ◽  
Author(s):  
H. Bouyanfif ◽  
J. Wolfman ◽  
M. El Marssi ◽  
Y. Yuzyuk ◽  
R. Bodeux ◽  
...  
Keyword(s):  
Thin Film ◽  
Raman Spectroscopy ◽  
Film Growth ◽  
Thin Film Growth ◽  
Tio3 Thin Film ◽  
X Ray Diffraction ◽  
X Ray

X-ray diffraction analysis of YBaCuO ultra-thin film growth

1997 ◽  
Vol 251 (1-2) ◽  
pp. 65-69 ◽  
Author(s):  
G. Linker ◽  
D. Hüttner ◽  
O. Meyer ◽  
M. Ohkubo ◽  
J. Reiner
Keyword(s):  
Thin Film ◽  
Diffraction Analysis ◽  
Film Growth ◽  
Thin Film Growth ◽  
X Ray Diffraction ◽  
X Ray ◽  
Ultra Thin Film

Electrodeposition of lithium phthalocyanine thin films: Part I. Structure and morphology

1999 ◽  
Vol 14 (5) ◽  
pp. 2162-2172 ◽  
Author(s):  
M. Brinkmann ◽  
S. Graff ◽  
C. Chaumont ◽  
J-J. André
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Indium Tin Oxide ◽  
Film Growth ◽  
Oxidation Potential ◽  
Thin Film Growth ◽  
Ex Situ ◽  
X Ray Diffraction ◽  
X Ray ◽  
Film Synthesis

A new thin film synthesis route based on the electrochemical oxidation of PcLi2 and deposition of lithium phthalocyanine (PcLi) onto indium tin oxide (ITO) substrate is demonstrated. The effects on the thin film morphology of various parameters such as the electrolysis time, the nature of the solvent, and the oxidation potential are investigated. The thin film growth is studied via x-ray diffraction, potential step experiments, and ex situ scanning electron microscopy. Various morphologies of the x-form thin films are observed for different electrolysis times and solvents. Thin films grown in acetonitrile of thickness above 1 μm consist in unidirectionally oriented needle-shaped crystallites.

Real-time x-ray scattering studies of thin-film growth and processing

1997 ◽  
Author(s):  
R. L. Headrick
Keyword(s):  
Thin Film ◽  
Real Time ◽  
Film Growth ◽  
Thin Film Growth ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

Real-time studies of thin film growth: Measurement and analysis of X-ray growth oscillations beyond the anti-Bragg point

2009 ◽  
Vol 167 (1) ◽  
pp. 11-18 ◽  
Author(s):  
S. Kowarik ◽  
A. Gerlach ◽  
M. W. A Skoda ◽  
S. Sellner ◽  
F. Schreiber
Keyword(s):  
Thin Film ◽  
Real Time ◽  
Film Growth ◽  
Thin Film Growth ◽  
X Ray ◽  
Growth Measurement ◽  
Measurement And Analysis

In-situ study of Ni–Ti thin film growth on a TiN intermediate layer by X-ray diffraction

2007 ◽  
Vol 126 (1) ◽  
pp. 332-337 ◽  
Author(s):  
R MARTINS ◽  
N SCHELL ◽  
R SILVA ◽  
L PEREIRA ◽  
K MAHESH ◽  
...  
Keyword(s):  
Thin Film ◽  
Intermediate Layer ◽  
Film Growth ◽  
Thin Film Growth ◽  
X Ray Diffraction ◽  
X Ray ◽  
In Situ Study

scholarly journals Epitaxial thin-film growth ofC60onVSe2studied with scanning tunneling microscopy and x-ray diffraction

1999 ◽  
Vol 59 (20) ◽  
pp. 13394-13400 ◽  
Author(s):  
R. Schwedhelm ◽  
J.-P. Schlomka ◽  
S. Woedtke ◽  
R. Adelung ◽  
L. Kipp ◽  
...  
Keyword(s):  
Thin Film ◽  
Scanning Tunneling Microscopy ◽  
Film Growth ◽  
Thin Film Growth ◽  
Scanning Tunneling ◽  
X Ray Diffraction ◽  
Tunneling Microscopy ◽  
Epitaxial Thin Film ◽  
X Ray ◽  
Epitaxial Thin Film Growth

Real-time X-ray scattering studies on temperature dependence of perfluoropentacene thin film growth

2013 ◽  
Vol 114 (4) ◽  
pp. 043515 ◽  
Author(s):  
C. Frank ◽  
J. Novák ◽  
A. Gerlach ◽  
G. Ligorio ◽  
K. Broch ◽  
...  
Keyword(s):  
Thin Film ◽  
Temperature Dependence ◽  
Real Time ◽  
Film Growth ◽  
Thin Film Growth ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

scholarly journals Surface-Controlled Crystal Alignment of Naphthyl End-Capped Oligothiophene on Graphene: Thin-Film Growth Studied by in Situ X-ray Diffraction

Langmuir ◽  
2020 ◽  
Vol 36 (8) ◽  
pp. 1898-1906 ◽  
Author(s):  
Mathias K. Huss-Hansen ◽  
Martin Hodas ◽  
Nada Mrkyvkova ◽  
Jakub Hagara ◽  
Bjarke B. E. Jensen ◽  
...  
Keyword(s):  
Thin Film ◽  
Film Growth ◽  
Thin Film Growth ◽  
X Ray Diffraction ◽  
X Ray ◽  
Crystal Alignment

In SituReal-Time X-Ray Diffraction During Thin Film Growth of Pentacene

2012 ◽  
Vol 566 (1) ◽  
pp. 18-21 ◽  
Author(s):  
T. Watanabe ◽  
T. Hosokai ◽  
T. Koganezawa ◽  
N. Yoshimoto
Keyword(s):  
Thin Film ◽  
Film Growth ◽  
Thin Film Growth ◽  
X Ray Diffraction ◽  
X Ray
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