Ion Beam Extraction from Large Bore 11 to 13 GHz ECR Ion Source with a Pair of Cylindrically Comb-Shaped Magnetic Fields

Author(s):  
T. Watanabe ◽  
T. Satani ◽  
Y. Matsui ◽  
F. Sato ◽  
Y. Kato ◽  
...  
1982 ◽  
Vol 21 (Part 2, No. 1) ◽  
pp. L4-L6 ◽  
Author(s):  
Seitaro Matsuo ◽  
Yoshio Adachi

2018 ◽  
Vol 4 (3) ◽  
Author(s):  
Hu Chundong ◽  
Wu Mingshan ◽  
Xie Yahong ◽  
Wei Jianglong ◽  
Yu Ling

During the process of beam extraction in positive ion source under high voltage region, a large number of electrons are produced in the gaps of grids. After back-streaming acceleration, these electrons go back to arc chamber or impinge grids and then heat back plate or grids, which are harmful for the safety of ion source. Under the situation of poor beam extraction optics, a large part of the primary beam ions bombard the surface of suppressor grid (SG). And this process produces a large number of electrons. Due to the huge extracted voltage, the secondary electron emission coefficient of the SG surface is also high. As a result, the grids' current grows. According to the measurement of the current of SG and the calculation of the perveance of the corresponding shoot, the effect of ion beam divergence angle on back-streaming electrons can be analyzed. When the beam divergence angle increases, the number of back-streaming electrons increases rapidly, and grids' current changes significantly, especially the current of gradient grid and SG. The results can guide the parameters operating on the ion source for Experimental Advanced Superconducting Tokamak-neutral beam injection (EAST-NBI) and find the reasonable operation interval of perveance and to ensure the safety and stable running of the ion source, which has great significance on the development of long pulse, high power ion source.


1982 ◽  
Vol 53 (9) ◽  
pp. 6018-6028 ◽  
Author(s):  
Junzo Ishikawa ◽  
Fumimichi Sano ◽  
Toshinori Takagi

2004 ◽  
Vol 75 (5) ◽  
pp. 1494-1496 ◽  
Author(s):  
L. Ma ◽  
M. T. Song ◽  
Z. M. Zhang ◽  
Y. Cao ◽  
X. Y. Chen

2008 ◽  
Vol 79 (2) ◽  
pp. 02C111 ◽  
Author(s):  
H. Tobari ◽  
M. Hanada ◽  
M. Kashiwagi ◽  
M. Taniguchi ◽  
N. Umeda ◽  
...  

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