Electronic structure characterization of La2NiMnO6 epitaxial thin films using synchrotron-radiation photoelectron spectroscopy and optical spectroscopy
2015 ◽
Vol 39
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pp. 186-190
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2015 ◽
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pp. 1720-1731
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1991 ◽
Vol 9
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Vol 50
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pp. 063001
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