Interdiffusions in thin‐film Au on Pt on GaAs (100) studied with Auger spectroscopy

1975 ◽  
Vol 46 (10) ◽  
pp. 4237-4243 ◽  
Author(s):  
C. C. Chang ◽  
S. P. Murarka ◽  
V. Kumar ◽  
G. Quintana
Keyword(s):  
Thin Film ◽  
Auger Spectroscopy

Structural and Concentration Heterogeneities during Formation of Silicide Phases in the Thin Film System Ti(5nm)/Ni(24nm)/Si(001)

2013 ◽  
Vol 344 ◽  
pp. 79-84
Author(s):  
S.I. Sidorenko ◽  
S.M. Voloshko ◽  
Yu.M. Мakogon ◽  
O.P. Pavlov ◽  
I.E. Kotenko ◽  
...  
Keyword(s):  
Thin Film ◽  
Mass Spectrometry ◽  
Solid State ◽  
Auger Spectroscopy ◽  
Solid State Reactions ◽  
Layer By Layer ◽  
Film System ◽  
X Ray ◽  
Thin Film System ◽  
Secondary Ions

By the methods of Auger-spectroscopy and mass-spectrometry of secondary ions, small-angle electron diffraction, X-ray and resistometry analyses the solid-state reactions in the Ti(5 nm)/ Ni(24 nm)/Si(001) thin film system at annealing in running nitrogen in the temperature interval of 723 – 1273 К are investigated. Regularities of phase transformations, consistency of solid-state reactions, layer-by-layer redistribution of components during annealing, features of surface morphology during formation of inclusions of silicide phases are established.

Auger spectroscopy and properties of Ir(Pt)/PZT(PZT/PT)/Ir nanosized thin-film structures

2006 ◽  
Vol 48 (6) ◽  
pp. 1200-1204 ◽  
Author(s):  
V. P. Afanas’ev ◽  
P. V. Afanas’ev ◽  
I. V. Grekhov ◽  
L. A. Delimova ◽  
S. -P. Kim ◽  
...  
Keyword(s):  
Thin Film ◽  
Auger Spectroscopy

Thin-film continuity observed by Auger spectroscopy

1978 ◽  
Vol 22 (7) ◽  
pp. 277-280
Author(s):  
L. La Rotonda ◽  
G. Luzzi ◽  
L. Papagno
Keyword(s):  
Thin Film ◽  
Auger Spectroscopy

scholarly journals FORMATION OF MG2SI THIN FILMS ON SI (111) AND THEIR RESEARCH BY EOS AND EELS

2021 ◽  
pp. 30-34
Author(s):  
DMITRIY VLADIMIROVICH FOMIN ◽  
◽  
NIKITA SERGEEVICH NOVGORODTSEV ◽  
DMITRIY OLEGOVICH STRUKOV ◽  
ALEXEY VYACHESLAVOVICH POLYAKOV ◽  
...  
Keyword(s):  
Thin Film ◽  
Vacuum Chamber ◽  
Solid Phase ◽  
Auger Spectroscopy ◽  
Magnesium Silicide ◽  
Characteristic Energy ◽  
Electron Auger Spectroscopy ◽  
High Vapor ◽  
Electron Auger

The paper presents information on the results of the formation of a thin Mg2Si film on a silicon substrate by solid-phase epitaxy in an ultrahigh-vacuum chamber of the PHI model 590 device. There are a number of difficulties in the formation of magnesium silicide films due to the low condensation coefficient and high vapor pressure. Effective methods for the formation of Mg2Si are currently being sought. As a result of our experiment, a thin film was obtained, which was studied in-situ by the method of electron Auger spectroscopy and spectroscopy of characteristic energy losses by electrons. Analysis of the Auger electron spectrum showed the presence of magnesium and silicon atoms in the composition of the formed film. From the analysis of the EELS spectra, it was found that a thin film of silicide magnesium was formed.

Multilayer high Tc thin film structures fabricated by pulsed laser deposition of Y–Ba–Cu–O

1989 ◽  
Vol 4 (6) ◽  
pp. 1326-1329 ◽  
Author(s):  
E. W. Chase ◽  
T. Venkatesan ◽  
C. C. Chang ◽  
B. Wilkens ◽  
W. L. Feldmann ◽  
...  
Keyword(s):  
Thin Film ◽  
Pulsed Laser Deposition ◽  
Zirconium Oxide ◽  
Room Temperature ◽  
Depth Profiling ◽  
Pulsed Laser ◽  
Auger Spectroscopy ◽  
Laser Deposition ◽  
High Tc ◽  
Zirconium Oxide Film

The pulsed laser deposition technique was used to deposit stoichiometric thin films from multi-component targets. By changing the target during deposition, multilayer thin film structures were fabricated. We have prepared multilayer structures consisting of alternating superconducting layers with different compositions and elements separated by thin insulating layers. The sharpness of the interfaces was studied by Auger spectroscopy depth profiling. Comparison of films deposited at room temperature and at 680 °C showed that a 10 nm yttrium stabilized zirconium oxide film can completely prevent gross interdiffusion between Y–Ba–Cu–O films and between Y–Ba–Cu–O and Si.

Clean Electron Microscope Substrate Films Used for Micrometeorite Collection and Study

1967 ◽  
Vol 25 ◽  
pp. 366-367
Author(s):  
D. M. Davies ◽  
R. Kemner ◽  
E. F. Fullam
Keyword(s):  
Thin Film ◽  
Electron Microscope ◽  
High Altitude ◽  
Amyl Acetate ◽  
Temperature Variations ◽  
Film Forming ◽  
Film Specimen ◽  
Particulate Contaminants

All serious electron microscopists at one time or another have been concerned with the cleanliness and freedom from artifacts of thin film specimen support substrates. This is particularly important where there are relatively few particles of a sample to be found for study, as in the case of micrometeorite collections. For the deposition of such celestial garbage through the use of balloons, rockets, and aircraft, the thin film substrates must have not only all the attributes necessary for use in the electron microscope, but also be able to withstand rather wide temperature variations at high altitude, vibration and shock inherent in the collection vehicle's operation and occasionally an unscheduled violent landing.Nitrocellulose has been selected as a film forming material that meets these requirements yet lends itself to a relatively simple clean-up procedure to remove particulate contaminants. A 1% nitrocellulose solution is prepared by dissolving “Parlodion” in redistilled amyl acetate from which all moisture has been removed.

Microtomy of spherical Al2O3 powders

1983 ◽  
Vol 41 ◽  
pp. 74-75
Author(s):  
E.J. Jenkins ◽  
D.S. Tucker ◽  
J.J. Hren
Keyword(s):  
Thin Film ◽  
Size Range ◽  
Particle Aggregation ◽  
Ion Milling ◽  
Thin Sections ◽  
Α Phase ◽  
Convenient Means ◽  
Van Der Waals Attraction ◽  
Negative Feature ◽  
Film Substrate

The size range of mineral and ceramic particles of one to a few microns is awkward to prepare for examination by TEM. Electrons can be transmitted through smaller particles directly and larger particles can be thinned by crushing and dispersion onto a substrate or by embedding in a film followed by ion milling. Attempts at dispersion onto a thin film substrate often result in particle aggregation by van der Waals attraction. In the present work we studied 1-10 μm diameter Al2O3 spheres which were transformed from the amprphous state to the stable α phase.After the appropriate heat treatment, the spherical powders were embedded in as high a density as practicable in a hard EPON, and then microtomed into thin sections. There are several advantages to this method. Obviously, this is a rapid and convenient means to study the microstructure of serial slices. EDS, ELS, and diffraction studies are also considerably more informative. Furthermore, confidence in sampling reliability is considerably enhanced. The major negative feature is some distortion of the microstructure inherent to the microtoming operation; however, this appears to have been surprisingly small. The details of the method and some typical results follow.

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