Molecular structure and carrier distributions at semiconductor/dielectric interfaces in organic field-effect transistors studied with sum frequency generation microscopy

2009 ◽  
Vol 95 (24) ◽  
pp. 243304 ◽  
Author(s):  
Ikuyo F. Nakai ◽  
Masaaki Tachioka ◽  
Akito Ugawa ◽  
Tadashi Ueda ◽  
Kazuya Watanabe ◽  
...  
Author(s):  
Chiho Katagiri ◽  
Takayuki Miyamae ◽  
Hao Li ◽  
Fangyuan Yang ◽  
Steven Baldelli

Sum frequency generation imaging microscopy was applied to visualize the internal electric-field behavior in operating organic field effect transistors.


2017 ◽  
Vol 19 (25) ◽  
pp. 16875-16880 ◽  
Author(s):  
Jan Schaefer ◽  
Grazia Gonella ◽  
Mischa Bonn ◽  
Ellen H. G. Backus

Surface-specific vibrational sum-frequency generation spectroscopy (V-SFG) is used to obtain information about the molecular structure at charged interfaces.


2010 ◽  
Vol 133 (23) ◽  
pp. 234702 ◽  
Author(s):  
Björn Braunschweig ◽  
Prabuddha Mukherjee ◽  
Robert B. Kutz ◽  
Andrzej Wieckowski ◽  
Dana D. Dlott

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