scholarly journals Mapping Accumulated Charges at the Semiconductor/Insulator Interface of Organic Field-Effect Transistors by Sum-Frequency Generation Spectroscopy

2018 ◽  
Vol 16 (0) ◽  
pp. 364-369
Author(s):  
Haiya Yang ◽  
Takayuki Miyamae ◽  
Masato Miyashita
Author(s):  
Chiho Katagiri ◽  
Takayuki Miyamae ◽  
Hao Li ◽  
Fangyuan Yang ◽  
Steven Baldelli

Sum frequency generation imaging microscopy was applied to visualize the internal electric-field behavior in operating organic field effect transistors.


Author(s):  
Xia Li ◽  
Günther Rupprechter

Sum frequency generation (SFG) vibrational spectroscopy is applied to ambient pressure surface science studies of adsorption and catalytic reactions at solid/gas interfaces.


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