Microstructural properties and dislocation evolution on a GaN grown on patterned sapphire substrate: A transmission electron microscopy study

Sapphire Substrate ◽

Microscopy Study ◽

Microstructural Properties ◽

Patterned Sapphire Substrate ◽

Proceedings of JSME-IIP/ASME-ISPS Joint Conference on Micromechatronics for Information and Precision Equipment IIP/ISPS joint MIPE ◽

WeC-2-1 Transmission electron microscopy study on origin of threading dislocations in GaN layer grown on patterned sapphire substrate

10.1299/jsmemipe.2015._wec-2-1-1 ◽

2015 ◽

Vol 2015 (0) ◽

pp. _WeC-2-1-1-_WeC-2-1-3

Author(s):

Tohoru Matsubara ◽

Kohei Sugimoto ◽

Narihito Okada ◽

Kazuyuki Tadatomo

Keyword(s):

Electron Microscopy ◽

Sapphire Substrate ◽

Microscopy Study ◽

Threading Dislocations ◽

Patterned Sapphire Substrate ◽

Microstructural Properties and Defect Evolution on Nitride Compound Semiconductors Grown on Patterned Substrates: A Transmission Electron Microscopy Study

Microscopy and Microanalysis ◽

10.1017/s1431927611008154 ◽

2011 ◽

Vol 17 (S2) ◽

pp. 1456-1457

Author(s):

Y Kim ◽

Y Noh ◽

S Han ◽

M Kim

Keyword(s):

Electron Microscopy ◽

Compound Semiconductors ◽

Microscopy Study ◽

Microstructural Properties ◽

Patterned Substrates ◽

Transmission Electron ◽

Defect Evolution

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Transmission electron microscopy study of microstructural properties and dislocation characterization in the GaN film grown on the cone-shaped patterned Al2O3substrate

Microscopy ◽

10.1093/jmicro/dft040 ◽

2013 ◽

Vol 63 (1) ◽

pp. 15-22 ◽

Cited By ~ 1

Author(s):

Jung Sik Park ◽

Jun-Mo Yang ◽

Kyung Jin Park ◽

Yun Chang Park ◽

Jung Ho Yoo ◽

...

Keyword(s):

Electron Microscopy ◽

Microscopy Study ◽

Microstructural Properties ◽

Transmission Electron ◽

Gan Film

High-resolution transmission electron microscopy study of defects and interfaces in epitaxial TiO 2 films on sapphire and LaAlO 3

Philosophical Magazine A ◽

10.1080/01418610110087291 ◽

2002 ◽

Vol 82 (4) ◽

pp. 735-749 ◽

Cited By ~ 3

Author(s):

J. Y.Huang ◽

B. H. Park ◽

David Jan ◽

X. Q. Pan ◽

Yuntian T. Zhu ◽

...

Keyword(s):

Electron Microscopy ◽

High Resolution ◽

Microscopy Study ◽

A SCANNING AND TRANSMISSION ELECTRON MICROSCOPY STUDY OF POOL BOILING SURFACES

10.1615/ihtc4.140 ◽

1970 ◽

Cited By ~ 2

Author(s):

G. H. Nix ◽

R.I. Vachon ◽

D. M. Hall

Keyword(s):

Electron Microscopy ◽

Pool Boiling ◽

Microscopy Study ◽

Transmission electron microscopy study of a precipitate which forms in the Al-Mg-Si system

Philosophical Magazine Letters ◽

10.1080/095008396180407 ◽

1996 ◽

Vol 74 (2) ◽

pp. 57-66 ◽

Cited By ~ 34

Author(s):

L. Sagalowicz ◽

G. Lapasset ◽

G. Hug

Keyword(s):

Electron Microscopy ◽

Microscopy Study ◽

In Situ Scanning Transmission Electron Microscopy Study of MoS2 Formation on Graphene with a Deep-Learning Framework

ACS Omega ◽

10.1021/acsomega.1c03002 ◽

2021 ◽

Author(s):

Yeongdong Lee ◽

Jongyeong Lee ◽

Handolsam Chung ◽

Jaemin Kim ◽

Zonghoon Lee

Keyword(s):

Electron Microscopy ◽

Scanning Transmission Electron Microscopy ◽

Microscopy Study ◽

Learning Framework ◽

Transmission Electron ◽

Scanning Transmission

In Situ Transmission Electron Microscopy Study on the Deformation Responses of Additively Manufactured Multiphase Ni-based Superalloy

Microscopy and Microanalysis ◽

10.1017/s1431927620019571 ◽

2020 ◽

Vol 26 (S2) ◽

pp. 1844-1846

Author(s):

Qianying Guo ◽

Michael M. Kirka ◽

Kinga A. Unocic

Keyword(s):

Electron Microscopy ◽

Microscopy Study ◽

1996 Conference on Optoelectronic and Microelectronic Materials and Devices. Proceedings ◽

An in-situ and ex-situ transmission electron microscopy study of the substrate orientational dependence of the solid-phase epitaxial growth of amorphized GaAs

10.1109/commad.1996.610160 ◽

2002 ◽

Author(s):

K.B. Belay ◽

M.C. Ridgway ◽

D.J. Llewellyn

Keyword(s):

Electron Microscopy ◽

Epitaxial Growth ◽

Solid Phase ◽

Microscopy Study ◽

Ex Situ ◽

A scanning electron microscopy/transmission electron microscopy study of the photocrystallization of amorphous silicon

Journal of Applied Physics ◽

10.1063/1.331800 ◽

1983 ◽

Vol 54 (10) ◽

pp. 5760-5763 ◽

Cited By ~ 5

Author(s):

A. Prasad ◽

K. Ebihara ◽

P. K. John ◽

B. Y. Tong ◽

S. K. Wong ◽

...

Keyword(s):

Electron Microscopy ◽

Scanning Electron Microscopy ◽

Amorphous Silicon ◽

Microscopy Study ◽

Transmission Electron ◽

Scanning Electron