Auger electron spectroscopy and electron loss spectroscopy comparative study of vacuum annealing effects on InP surface

Journal of Applied Physics ◽

10.1063/1.334795 ◽

1985 ◽

Vol 57 (2) ◽

pp. 237-243 ◽

Author(s):

J. Massies ◽

F. Lemaire‐Dezaly

Keyword(s):

Comparative Study ◽

Auger Electron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Vacuum Annealing ◽

Electron Loss ◽

Annealing Effects ◽

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ChemInform Abstract: Comparative Study on the Passivation and Localized Corrosion of α - and β-Brass in Borate Buffer Solutions Containing Sodium Chloride. Part 2. X-Ray Photoelectron and Auger Electron Spectroscopy Data.

10.1002/chin.199514014 ◽

2010 ◽

Vol 26 (14) ◽

pp. no-no

Author(s):

J. MORALES ◽

P. ESPARZA ◽

G. T. FERNANDEZ ◽

S. GONZALEZ ◽

J. E. GARCIA ◽

...

Keyword(s):

Sodium Chloride ◽

Comparative Study ◽

Auger Electron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Localized Corrosion ◽

Spectroscopy Data ◽

X Ray ◽

Buffer Solutions ◽

Auger Electron Spectroscopy Data

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Auger electron spectroscopy and low energy electron loss spectroscopy investigations of plasma- nitrided thin thermal SiO2 and native oxide on silicon

Thin Solid Films ◽

10.1016/0040-6090(91)90098-i ◽

1991 ◽

Vol 202 (2) ◽

pp. 267-282 ◽

Author(s):

E.D. Atanassova ◽

A.V. Shopov

Keyword(s):

Auger Electron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Energy Electron ◽

Native Oxide ◽

Electron Loss ◽

Low Energy Electron

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Low-energy electron-loss spectroscopy and Auger-electron-spectroscopy studies of noble-metal—silicon interfaces: Si-Au system

Physical Review B ◽

10.1103/physrevb.26.1125 ◽

1982 ◽

Vol 26 (3) ◽

pp. 1125-1138 ◽

Author(s):

P. Perfetti ◽

S. Nannarone ◽

F. Patella ◽

C. Quaresima ◽

M. Capozi ◽

...

Keyword(s):

Auger Electron Spectroscopy ◽

Noble Metal ◽

Electron Spectroscopy ◽

Auger Electron ◽

Energy Electron ◽

Electron Loss ◽

Low Energy Electron ◽

Spectroscopy Studies

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A comparative study of thin film diffusion measurements in metallic glasses by Rutherford backscattering spectrometry and Auger electron spectroscopy

Thin Solid Films ◽

10.1016/0040-6090(88)90105-8 ◽

1988 ◽

Vol 164 ◽

pp. 33-36

Author(s):

S.K. Sharma ◽

S. Banerjee ◽

Kuldeep ◽

Animesh K. Jain

Keyword(s):

Thin Film ◽

Comparative Study ◽

Auger Electron Spectroscopy ◽

Metallic Glasses ◽

Electron Spectroscopy ◽

Auger Electron ◽

Rutherford Backscattering Spectrometry ◽

Rutherford Backscattering ◽

Film Diffusion ◽

Thin Film Diffusion

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A comparative study on the passivation and localized corrosion of α- and β-brass in borate buffer solutions containing sodium chloride—II. X-ray photoelectron and Auger electron spectroscopy data

Corrosion Science ◽

10.1016/0010-938x(94)00109-j ◽

1995 ◽

Vol 37 (2) ◽

pp. 231-239 ◽

Author(s):

J. Morales ◽

P. Esparza ◽

G.T. Fernandez ◽

S. Gonzalez ◽

J.E. Garcia ◽

...

Keyword(s):

Sodium Chloride ◽

Comparative Study ◽

Auger Electron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Localized Corrosion ◽

Spectroscopy Data ◽

X Ray ◽

Buffer Solutions ◽

Auger Electron Spectroscopy Data

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A comparative study of surface oxidation behaviour of amorphous and crystallized Ni36Fe32Cr14P12B6 metallic glass using Auger Electron Spectroscopy

Solid State Communications ◽

10.1016/0038-1098(84)90281-3 ◽

1984 ◽

Vol 50 (11) ◽

pp. 1027-1031 ◽

Author(s):

P.P. Karve ◽

M.G. Thube ◽

S.K. Kulkarni ◽

A.S. Nigavekar

Keyword(s):

Metallic Glass ◽

Comparative Study ◽

Auger Electron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Surface Oxidation ◽

Oxidation Behaviour

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A comparative study of single crystal magnesium oxide and oxidised magnesium by auger electron spectroscopy

Surface Science ◽

10.1016/0039-6028(75)90268-x ◽

1975 ◽

Vol 47 (1) ◽

pp. 41-47 ◽

Author(s):

A.P. Janssen ◽

R.C. Schoonmaker ◽

A. Chambers

Keyword(s):

Comparative Study ◽

Single Crystal ◽

Auger Electron Spectroscopy ◽

Magnesium Oxide ◽

Electron Spectroscopy ◽

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Effect of Vacuum Annealing on the Surface Chemistry of Electrodeposited Copper(I) Oxide Layers as Probed by Positron Annihilation Induced Auger Electron Spectroscopy

Langmuir ◽

10.1021/la062709a ◽

2007 ◽

Vol 23 (4) ◽

pp. 1830-1834 ◽

Author(s):

M. P. Nadesalingam ◽

S. Mukherjee ◽

S. Somasundaram ◽

C. R. Chenthamarakshan ◽

Norma R. de Tacconi ◽

...

Keyword(s):

Surface Chemistry ◽

Auger Electron Spectroscopy ◽

Positron Annihilation ◽

Electron Spectroscopy ◽

Auger Electron ◽

Vacuum Annealing ◽

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Oxide formation on the silicon (111) surface studied by Auger electron spectroscopy and by low energy electron loss spectroscopy

Thin Solid Films ◽

10.1016/0040-6090(79)90462-0 ◽

1979 ◽

Vol 61 (2) ◽

pp. 197-202 ◽

Author(s):

N. Lieske ◽

R. Hezel

Keyword(s):

Auger Electron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Energy Electron ◽

Electron Loss ◽

Oxide Formation ◽

Low Energy Electron

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Comparative study of the properties of ultrathin Si3N4films with Auger electron spectroscopy, spectroscopic ellipsometry, and Raman spectroscopy

Applied Physics Letters ◽

10.1063/1.105621 ◽

1991 ◽

Vol 59 (3) ◽

pp. 280-282 ◽

Author(s):

E. C. Paloura ◽

S. Logothetidis ◽

S. Boultadakis ◽

S. Ves

Keyword(s):

Raman Spectroscopy ◽

Comparative Study ◽

Auger Electron Spectroscopy ◽

Spectroscopic Ellipsometry ◽

Electron Spectroscopy ◽

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