Optical determination of free‐carrier concentration in epitaxial layers ofn‐type silicon grown on N+or N−substrates
Keyword(s):
Keyword(s):
1986 ◽
Vol 133
(7)
◽
pp. 1414-1416
◽
Keyword(s):
2008 ◽
Vol 34
(1)
◽
pp. 37-39
◽
Keyword(s):
1986 ◽
Vol 25
(Part 1, No. 4)
◽
pp. 652-653
◽