Determination of the free carrier concentration in ultra-pure GaAs epilayers by a photoreflectance technique
2008 ◽
Vol 34
(1)
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pp. 37-39
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Keyword(s):
1986 ◽
Vol 25
(Part 1, No. 4)
◽
pp. 652-653
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1999 ◽
Vol 103
(25)
◽
pp. 5280-5288
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Keyword(s):