Strain-compensation measurement and simulation of InGaAs/GaAsP multiple quantum wells by metal organic vapor phase epitaxy using wafer-curvature
2011 ◽
Vol 315
(1)
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pp. 1-4
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2002 ◽
Vol 41
(Part 1, No. 4B)
◽
pp. 2489-2492
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Keyword(s):
Keyword(s):
2011 ◽
Vol 314
(1)
◽
pp. 252-257
◽
2021 ◽
Keyword(s):
Keyword(s):