Room temperature polarized photoreflectance characterization of GaAlAs/InGaAs/GaAs high electron mobility transistor structures including the influence of strain relaxation

2000 ◽  
Vol 88 (2) ◽  
pp. 883-888 ◽  
Author(s):  
T. H. Chen ◽  
Y. S. Huang ◽  
D. Y. Lin ◽  
Fred H. Pollak ◽  
M. S. Goorsky ◽  
...  
2020 ◽  
Vol 257 (4) ◽  
pp. 1900589 ◽  
Author(s):  
Tadatoshi Ito ◽  
Ryota Sakamoto ◽  
Tatsuya Isono ◽  
Yongzhao Yao ◽  
Yukari Ishikawa ◽  
...  

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