Room temperature polarized photoreflectance characterization of GaAlAs/InGaAs/GaAs high electron mobility transistor structures including the influence of strain relaxation
1999 ◽
Vol 14
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pp. 103-109
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2000 ◽
Vol 8
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pp. 297-305
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1998 ◽
Vol 31
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pp. 159-164
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pp. 1638
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2020 ◽
Vol 257
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2008 ◽
Vol 28
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