Characterization of deep levels in high electron mobility transistor by conductance deep level transient spectroscopy

2008 ◽  
Vol 28 (5-6) ◽  
pp. 787-790 ◽  
Author(s):  
M. Gassoumi ◽  
J.M. Bluet ◽  
G. Guillot ◽  
C. Gaquière ◽  
H. Maaref
1990 ◽  
Vol 26 (3) ◽  
pp. 159 ◽  
Author(s):  
J. Goostray ◽  
H. Thomas ◽  
D.V. Morgan ◽  
E. Kohn ◽  
A. Christou ◽  
...  

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