Characterization of deep levels in high electron mobility transistor by conductance deep level transient spectroscopy
2008 ◽
Vol 28
(5-6)
◽
pp. 787-790
◽
2013 ◽
Vol 5
(10)
◽
pp. 1035-1038
1995 ◽
Vol 11
(10)
◽
pp. 1079-1082
◽
2000 ◽
Vol 18
(3)
◽
pp. 1638
◽
2009 ◽
Vol 24
(3)
◽
pp. 035013
◽