Temperature dependent thickness change in NiO/Si thin film system

2013 ◽  
Author(s):  
Suvankar Chakraborty ◽  
Subarna Mitra ◽  
Krishnakumar S. R. Menon
Keyword(s):  
Thin Film ◽  
Film System ◽  
Temperature Dependent ◽  
Thickness Change ◽  
Thin Film System ◽  
Si Thin Film

Interactions in the Co/Si thin‐film system. I. Kinetics

1978 ◽  
Vol 49 (7) ◽  
pp. 4005-4010 ◽  
Author(s):  
S. S. Lau ◽  
J. W. Mayer ◽  
K. N. Tu
Keyword(s):  
Thin Film ◽  
Film System ◽  
Thin Film System ◽  
Si Thin Film

Chemical structure and interface reaction of LaCoO3/Si thin-film system

2001 ◽  
Vol 32 (1) ◽  
pp. 310-313 ◽  
Author(s):  
Yingxia Zhang ◽  
Yongfa Zhu ◽  
Xiaoyan Ye ◽  
Lili Cao
Keyword(s):  
Thin Film ◽  
Chemical Structure ◽  
Interface Reaction ◽  
Film System ◽  
Thin Film System ◽  
Si Thin Film

Physical and dispersive optical characteristics of ZrON/Si thin-film system

2013 ◽  
Vol 115 (3) ◽  
pp. 1069-1072 ◽  
Author(s):  
Yew Hoong Wong ◽  
V. V. Atuchin ◽  
V. N. Kruchinin ◽  
Kuan Yew Cheong
Keyword(s):  
Thin Film ◽  
Optical Characteristics ◽  
Film System ◽  
Thin Film System ◽  
Si Thin Film

Temperature-dependent residual stresses in a hetero-epitaxial thin film system

2015 ◽  
Vol 584 ◽  
pp. 186-191 ◽  
Author(s):  
M. Liu ◽  
H.H. Ruan ◽  
L.C. Zhang ◽  
A. Moridi
Keyword(s):  
Thin Film ◽  
Residual Stresses ◽  
Film System ◽  
Temperature Dependent ◽  
Epitaxial Thin Film ◽  
Thin Film System

Interdiffusion and reactions in the Cu/TiN/Si thin film system

1996 ◽  
Vol 92 ◽  
pp. 335-339 ◽  
Author(s):  
Y.S. Gong ◽  
Jing-Cheng Lin ◽  
Chiapyng Lee
Keyword(s):  
Thin Film ◽  
Film System ◽  
Thin Film System ◽  
Si Thin Film

Interactions in the Co/Si thin‐film system. II. Diffusion‐marker experiments

1978 ◽  
Vol 49 (7) ◽  
pp. 4011-4020 ◽  
Author(s):  
G. J. van Gurp ◽  
W. F. van der Weg ◽  
D. Sigurd
Keyword(s):  
Thin Film ◽  
Film System ◽  
Thin Film System ◽  
Diffusion Marker ◽  
Si Thin Film

Silicidation in Ni/Si thin film system investigated by X-ray diffraction and Auger electron spectroscopy

2007 ◽  
Vol 253 (8) ◽  
pp. 3799-3802 ◽  
Author(s):  
S. Abhaya ◽  
G. Amarendra ◽  
S. Kalavathi ◽  
Padma Gopalan ◽  
M. Kamruddin ◽  
...  
Keyword(s):  
Thin Film ◽  
Auger Electron Spectroscopy ◽  
Electron Spectroscopy ◽  
Auger Electron ◽  
Film System ◽  
X Ray Diffraction ◽  
X Ray ◽  
Thin Film System ◽  
Si Thin Film
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