Asymmetric structure-induced hot-electron injection under hot-carrier stress in a-InGaZnO thin film transistor
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2020 ◽
Vol 131
(3)
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pp. 456-459
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1988 ◽
Vol 27
(Part 2, No. 12)
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pp. L2395-L2397
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2008 ◽
Vol 52
(6)
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pp. 844-848
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