Effects of hot-carrier stress on high performance polycrystalline silicon thin film transistor with a single perpendicular grain boundary

2007 ◽  
Vol 515 (19) ◽  
pp. 7598-7602
Author(s):  
I.H. Song ◽  
H.S. Shin ◽  
M.K. Han
Keyword(s):  
Thin Film ◽  
Grain Boundary ◽  
Polycrystalline Silicon ◽  
High Performance ◽  
Thin Film Transistor ◽  
Silicon Thin Film ◽  
Hot Carrier ◽  
Hot Carrier Stress

A High-Performance Polycrystalline Silicon Thin-Film Transistor Using Metal-Induced Crystallization with Ni Solution

1998 ◽  
Vol 37 (Part 1, No. 12B) ◽  
pp. 7193-7197 ◽  
Author(s):  
Soo Young Yoon ◽  
Sung Ki Kim ◽  
Jae Young Oh ◽  
YoungJin Choi ◽  
Woo Sung Shon ◽  
...  
Keyword(s):  
Thin Film ◽  
Polycrystalline Silicon ◽  
High Performance ◽  
Thin Film Transistor ◽  
Silicon Thin Film ◽  
Metal Induced Crystallization ◽  
Induced Crystallization

scholarly journals Enhanced degradation in polycrystalline silicon thin-film transistors under dynamic hot-carrier stress

2001 ◽  
Vol 22 (10) ◽  
pp. 475-477 ◽  
Author(s):  
Kow Ming Chang ◽  
Yuan Hung Chung ◽  
Gin Ming Lin ◽  
Chi Gun Deng ◽  
Jian Hong Lin
Keyword(s):  
Thin Film ◽  
Thin Film Transistors ◽  
Polycrystalline Silicon ◽  
Silicon Thin Film ◽  
Hot Carrier ◽  
Hot Carrier Stress ◽  
Enhanced Degradation
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