Electron trap studies in Al‐Ta‐O/CdSe thin‐film transistors using a hot electron injection method

1992 ◽  
Vol 71 (2) ◽  
pp. 786-790 ◽  
Author(s):  
Koji Nomura ◽  
Hisahito Ogawa
Keyword(s):  
Thin Film ◽  
Thin Film Transistors ◽  
Electron Injection ◽  
Electron Trap ◽  
Hot Electron ◽  
Injection Method ◽  
Cdse Thin Film ◽  
Hot Electron Injection

Asymmetric structure-induced hot-electron injection under hot-carrier stress in a-InGaZnO thin film transistor

2013 ◽  
Vol 103 (14) ◽  
pp. 143508 ◽  
Author(s):  
Ming-Yen Tsai ◽  
Ting-Chang Chang ◽  
Ann-Kuo Chu ◽  
Te-Chih Chen ◽  
Tien-Yu Hsieh ◽  
...  
Keyword(s):  
Thin Film ◽  
Thin Film Transistor ◽  
Electron Injection ◽  
Asymmetric Structure ◽  
Hot Electron ◽  
Hot Carrier ◽  
Hot Electron Injection ◽  
Hot Carrier Stress

Substrate-Bias Assisted Hot Electron Injection Method for High-Speed, Low-Voltage, and Multi-Bit Flash Memories

2011 ◽  
Vol 50 (12R) ◽  
pp. 124201 ◽  
Author(s):  
Ho-Myoung An ◽  
Hee-Dong Kim ◽  
Yongjie Zhang ◽  
Yu Jeong Seo ◽  
Tae Geun Kim
Keyword(s):  
High Speed ◽  
Low Voltage ◽  
Electron Injection ◽  
Substrate Bias ◽  
Hot Electron ◽  
Flash Memories ◽  
Injection Method ◽  
Hot Electron Injection

Rectification in Chiral Carbon Nanotubes with Hot Electron Injection

2020 ◽  
Vol 131 (3) ◽  
pp. 456-459
Author(s):  
S. S. Abukari ◽  
R. Musah ◽  
M. Amekpewu ◽  
S. Y. Mensah ◽  
N. G. Mensah ◽  
...  
Keyword(s):  
Carbon Nanotubes ◽  
Electron Injection ◽  
Hot Electron ◽  
Hot Electron Injection ◽  
Chiral Carbon

scholarly journals Simulation of GaAs submicron FET with hot-electron injection structure

1983 ◽  
Vol 19 (17) ◽  
pp. 697 ◽  
Author(s):  
K. Tomizawa ◽  
Y. Awano ◽  
N. Hashizume ◽  
M. Kawashima
Keyword(s):  
Electron Injection ◽  
Hot Electron ◽  
Hot Electron Injection

Interface State Generation Mechanism in MOSFET's during Substrate Hot-Electron Injection

1988 ◽  
Vol 27 (Part 2, No. 12) ◽  
pp. L2395-L2397 ◽  
Author(s):  
Naoki Yasuda ◽  
Hiroshi Nakamura ◽  
Kenji Taniguchi ◽  
Chihiro Hamaguchi ◽  
Masakazu Kakumu
Keyword(s):  
Electron Injection ◽  
Interface State ◽  
Generation Mechanism ◽  
Hot Electron ◽  
Hot Electron Injection ◽  
State Generation

Channel width dependence of hot electron injection program/hot hole erase cycling behavior in silicon-oxide-nitride-oxide-silicon (SONOS) memories

2008 ◽  
Vol 52 (6) ◽  
pp. 844-848 ◽  
Author(s):  
Seung-Hwan Seo ◽  
Se-Woon Kim ◽  
Jang-Uk Lee ◽  
Gu-Cheol Kang ◽  
Kang-Seob Roh ◽  
...  
Keyword(s):  
Silicon Oxide ◽  
Electron Injection ◽  
Channel Width ◽  
Hot Electron ◽  
Hot Electron Injection ◽  
Nitride Oxide ◽  
Cycling Behavior
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