Direct observation of bias-dependence potential distribution in metal/HfO2 gate stack structures by hard x-ray photoelectron spectroscopy under device operation

Potential Distribution ◽

Gate Stack ◽

X Ray ◽

Dependence Potential ◽

Bias-Dependence Potential Distribution in Gate Stack Structuresby Hard-X-ray Photoelectron Spectroscopy under Device Operation

Hyomen Kagaku ◽

10.1380/jsssj.35.361 ◽

2014 ◽

Vol 35 (7) ◽

pp. 361-364

Author(s):

Yoshiyuki YAMASHITA ◽

Hideki YOSHIKAWA ◽

Toyohiro CHIKYOW ◽

Keisuke KOBAYASHI

Keyword(s):

Potential Distribution ◽

Gate Stack ◽

X Ray ◽

Dependence Potential ◽

Pt metal-CeO2 interaction: Direct observation of redox coupling between Pt0/Pt2+/Pt4+ and Ce4+/Ce3+ states in Ce0.98Pt0.02O2−δ catalyst by a combined electrochemical and x-ray photoelectron spectroscopy study

The Journal of Chemical Physics ◽

10.1063/1.3089666 ◽

2009 ◽

Vol 130 (11) ◽

pp. 114706 ◽

Cited By ~ 29

Author(s):

Sudhanshu Sharma ◽

M. S. Hegde

Keyword(s):

Direct Observation ◽

Spectroscopy Study ◽

X Ray

Origin of Fermi level pinning in high-k gate stack structures studied by operando hard x-ray photoelectron spectroscopy

Journal of Electron Spectroscopy and Related Phenomena ◽

10.1016/j.elspec.2019.146890 ◽

2020 ◽

Vol 238 ◽

pp. 146890 ◽

Cited By ~ 1

Author(s):

Yoshiyuki Yamashita ◽

Toyohiro Chikyow

Keyword(s):

Fermi Level ◽

Gate Stack ◽

X Ray ◽

Fermi Level Pinning ◽

High K

Direct observation of the non-supported metal nanoparticle electron density of states by X-ray photoelectron spectroscopy

The European Physical Journal D ◽

10.1140/epjd/e2007-00252-0 ◽

2007 ◽

Vol 45 (2) ◽

pp. 295-299 ◽

Cited By ~ 15

Author(s):

M. Tchaplyguine ◽

S. Peredkov ◽

A. Rosso ◽

J. Schulz ◽

G. Öhrwall ◽

...

Keyword(s):

Electron Density ◽

Density Of States ◽

Direct Observation ◽

Metal Nanoparticle ◽

X Ray ◽

Electron Density Of States ◽

Supported Metal

New Direct Spectroscopic Method for Determination of Bias-Dependent Electronic States: Hard X-ray Photoelectron Spectroscopy Under Device Operation

Japanese Journal of Applied Physics ◽

10.7567/jjap.52.108005 ◽

2013 ◽

Vol 52 (10R) ◽

pp. 108005 ◽

Cited By ~ 3

Author(s):

Yoshiyuki Yamashita ◽

Hideki Yoshikawa ◽

Toyohiro Chikyo ◽

Keisuke Kobayashi

Keyword(s):

Spectroscopic Method ◽

Electronic States ◽

X Ray ◽

Bias dependent potential distribution of a Pt/HfO2/SiO2/Si gate structure obtained from a bias application in hard X-ray photoelectron spectroscopy

Japanese Journal of Applied Physics ◽

10.7567/jjap.53.05fh05 ◽

2014 ◽

Vol 53 (5S1) ◽

pp. 05FH05 ◽

Cited By ~ 1

Author(s):

Yoshiyuki Yamashita ◽

Hideki Yoshikawa ◽

Toyohiro Chikyo

Keyword(s):

Potential Distribution ◽

X Ray ◽

Gate Structure ◽

Dependent Potential

Direct Observation of the Thermal Desorption of Oxygen from the Surface of β-Copperphthalocyanine by X-Ray Photoelectron Spectroscopy

Japanese Journal of Applied Physics ◽

10.1143/jjap.21.822 ◽

1982 ◽

Vol 21 (Part 1, No. 6) ◽

pp. 822-824 ◽

Cited By ~ 6

Author(s):

Jin Mizuguchi

Keyword(s):

Thermal Desorption ◽

Direct Observation ◽

X Ray

Direct observation of N-(group V) bonding defects in dilute nitride semiconductors using hard x-ray photoelectron spectroscopy

Applied Physics Letters ◽

10.1063/1.3573789 ◽

2011 ◽

Vol 98 (12) ◽

pp. 121915 ◽

Cited By ~ 10

Author(s):

F. Ishikawa ◽

S. Fuyuno ◽

K. Higashi ◽

M. Kondow ◽

M. Machida ◽

...

Keyword(s):

Direct Observation ◽

Dilute Nitride ◽

Nitride Semiconductors ◽

Group V ◽

X Ray ◽

Dilute Nitride Semiconductors

(Invited) Direct Observation of Electronic States in Gate Stack Structures: XPS under Device Operation

ECS Transactions ◽

10.1149/1.3633313 ◽

2019 ◽

Vol 41 (7) ◽

pp. 331-336 ◽

Cited By ~ 4

Author(s):

Yoshiyuki Yamashita ◽

Hideki Yoshikawa ◽

Toyohiro Chikyo ◽

Keisuke Kobayashi

Keyword(s):

Direct Observation ◽

Electronic States ◽

Gate Stack ◽

ChemInform Abstract: DIRECT OBSERVATION OF SULFUR COORDINATION IN BEAN PLASTOCYANIN BY X-RAY PHOTOELECTRON SPECTROSCOPY

Chemischer Informationsdienst ◽

10.1002/chin.197536087 ◽

1975 ◽

Vol 6 (36) ◽

Author(s):

EDWARD I. SOLOMON ◽

PAULA J. CLENDENING ◽

HARRY B. GRAY ◽

F. J. GRUNTHANER

Keyword(s):

Direct Observation ◽

X Ray