(Invited) Direct Observation of Electronic States in Gate Stack Structures: XPS under Device Operation

2019 ◽  
Vol 41 (7) ◽  
pp. 331-336 ◽  
Author(s):  
Yoshiyuki Yamashita ◽  
Hideki Yoshikawa ◽  
Toyohiro Chikyo ◽  
Keisuke Kobayashi
Keyword(s):  
Direct Observation ◽  
Electronic States ◽  
Gate Stack ◽  
Device Operation

scholarly journals Erratum: “Direct observation of the electronic states of single crystalline rubrene under ambient condition by photoelectron yield spectroscopy” [Appl. Phys. Lett. 93, 173305 (2008)]

2012 ◽  
Vol 100 (26) ◽  
pp. 269901
Author(s):  
Yasuo Nakayama ◽  
Shinichi Machida ◽  
Takeo Minari ◽  
Kazuhito Tsukagoshi ◽  
Yutaka Noguchi ◽  
...  
Keyword(s):  
Direct Observation ◽  
Electronic States ◽  
Ambient Condition ◽  
Single Crystalline

Direct observation of Al-doping-induced electronic states in the valence band and band gap of ZnO films

2011 ◽  
Vol 84 (15) ◽  
Author(s):  
Mercedes Gabás ◽  
Piero Torelli ◽  
Nicholas T. Barrett ◽  
Maurizio Sacchi ◽  
Fabien Bruneval ◽  
...  
Keyword(s):  
Band Gap ◽  
Valence Band ◽  
Direct Observation ◽  
Electronic States ◽  
Zno Films ◽  
Al Doping

scholarly journals Bias-Dependence Potential Distribution in Gate Stack Structuresby Hard-X-ray Photoelectron Spectroscopy under Device Operation

Hyomen Kagaku ◽  
2014 ◽  
Vol 35 (7) ◽  
pp. 361-364
Author(s):  
Yoshiyuki YAMASHITA ◽  
Hideki YOSHIKAWA ◽  
Toyohiro CHIKYOW ◽  
Keisuke KOBAYASHI
Keyword(s):  
Photoelectron Spectroscopy ◽  
Potential Distribution ◽  
Gate Stack ◽  
X Ray ◽  
Dependence Potential ◽  
Device Operation
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