Channel length dependence of negative-bias-illumination-stress in amorphous-indium-gallium-zinc-oxide thin-film transistors

2015 ◽  
Vol 117 (23) ◽  
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Author(s):  
Jae Gwang Um ◽  
Mallory Mativenga ◽  
Piero Migliorato ◽  
Jin Jang
2012 ◽  
Vol 51 ◽  
pp. 03CB03 ◽  
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Soo-Yeon Lee ◽  
Sun-Jae Kim ◽  
Young Wook Lee ◽  
Woo-Geun Lee ◽  
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2012 ◽  
Vol 51 (3S) ◽  
pp. 03CB03
Author(s):  
Soo-Yeon Lee ◽  
Sun-Jae Kim ◽  
Young Wook Lee ◽  
Woo-Geun Lee ◽  
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