Mechanism of positive bias stress-assisted recovery in amorphous-indium-gallium-zinc-oxide thin-film transistors from negative bias under illumination stress

2013 ◽  
Vol 103 (3) ◽  
pp. 033501 ◽  
Author(s):  
Jae Gwang Um ◽  
Mallory Mativenga ◽  
Jin Jang
Keyword(s):  
Thin Film ◽  
Zinc Oxide ◽  
Thin Film Transistors ◽  
Oxide Thin Film ◽  
Negative Bias ◽  
Indium Gallium Zinc Oxide ◽  
Positive Bias ◽  
Zinc Oxide Thin Film ◽  
Bias Stress ◽  
Indium Gallium

Light/negative bias stress instabilities in indium gallium zinc oxide thin film transistors explained by creation of a double donor

2012 ◽  
Vol 101 (12) ◽  
pp. 123502 ◽  
Author(s):  
Piero Migliorato ◽  
Md Delwar Hossain Chowdhury ◽  
Jae Gwang Um ◽  
Manju Seok ◽  
Jin Jang
Keyword(s):  
Thin Film ◽  
Zinc Oxide ◽  
Thin Film Transistors ◽  
Oxide Thin Film ◽  
Negative Bias ◽  
Indium Gallium Zinc Oxide ◽  
Zinc Oxide Thin Film ◽  
Bias Stress ◽  
Indium Gallium
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