scholarly journals Photo-assisted Kelvin probe force microscopy investigation of three dimensional GaN structures with various crystal facets, doping types, and wavelengths of illumination

2017 ◽  
Vol 122 (8) ◽  
pp. 085307 ◽  
Author(s):  
Manal Ali Deeb ◽  
Johannes Ledig ◽  
Jiandong Wei ◽  
Xue Wang ◽  
Hergo-Heinrich Wehmann ◽  
...  
Keyword(s):  
Three Dimensional ◽  
Kelvin Probe Force Microscopy ◽  
Kelvin Probe ◽  
Force Microscopy ◽  
Microscopy Investigation

scholarly journals Illustration of charge transfer in graphene-coated hexagonal ZnO photocatalysts using Kelvin probe force microscopy

RSC Advances ◽  
2018 ◽  
Vol 8 (2) ◽  
pp. 885-894 ◽  
Author(s):  
Yunlong Zhang ◽  
Yuzhi Zhang ◽  
Lixin Song ◽  
Yang Su ◽  
Yunfeng Guo ◽  
...  
Keyword(s):  
Charge Transfer ◽  
Three Dimensional ◽  
Kelvin Probe Force Microscopy ◽  
Methyl Blue ◽  
Kelvin Probe ◽  
Force Microscopy ◽  
Before And After

The Fermi levels and three-dimensional band diagrams of the synthesized HZO@Gr composites in methyl blue (MB) solution before and after equilibrium were assumed.

Suppression of the morphology mismatch at graphene/n-type organic semiconductor interfaces: a scanning Kelvin probe force microscopy investigation

2020 ◽  
Vol 8 (24) ◽  
pp. 8145-8154 ◽  
Author(s):  
Federico Chianese ◽  
Fabio Chiarella ◽  
Mario Barra ◽  
Andrea Candini ◽  
Marco Affronte ◽  
...  
Keyword(s):  
Organic Semiconductor ◽  
Kelvin Probe Force Microscopy ◽  
Kelvin Probe ◽  
Force Microscopy ◽  
Graphene Electrode ◽  
Semiconductor Interfaces ◽  
Scanning Kelvin Probe ◽  
Microscopy Investigation ◽  
Contact Effects

Contact effects occurring at organic-semiconductor/graphene-electrode interfaces are directly analyzed in unprecedented detail in n-type OFETs via scanning Kelvin probe force microscopy.

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