scholarly journals Time-resolved near-edge X-ray absorption fine structure of pyrazine from electronic structure and nuclear wave packet dynamics simulations

2019 ◽  
Vol 151 (12) ◽  
pp. 124114 ◽  
Author(s):  
Shota Tsuru ◽  
Marta L. Vidal ◽  
Mátyás Pápai ◽  
Anna I. Krylov ◽  
Klaus B. Møller ◽  
...  
Keyword(s):  
Electronic Structure ◽  
Fine Structure ◽  
Wave Packet ◽  
Time Resolved ◽  
X Ray ◽  
Absorption Fine ◽  
Wave Packet Dynamics ◽  
Dynamics Simulations ◽  
X Ray Absorption

Local electronic structure analysis of Zn-doped BiFeO3 powders by X-ray absorption fine structure spectroscopy

2017 ◽  
Vol 710 ◽  
pp. 843-849 ◽  
Author(s):  
Turghunjan Gholam ◽  
Abduleziz Ablat ◽  
Mamatrishat Mamat ◽  
Rong Wu ◽  
Aimierding Aimidula ◽  
...  
Keyword(s):  
Electronic Structure ◽  
Fine Structure ◽  
Structure Analysis ◽  
X Ray ◽  
Absorption Fine ◽  
Local Electronic Structure ◽  
X Ray Absorption

scholarly journals In situ time-resolved dispersive X-ray absorption fine structure analysis of BaTiO3–LiCoO2 composites for lithium ion batteries

2016 ◽  
Vol 124 (6) ◽  
pp. 659-663 ◽  
Author(s):  
Takashi TERANISHI ◽  
Yumi YOSHIKAWA ◽  
Ryota MIYAHARA ◽  
Hidetaka HAYASHI ◽  
Akira KISHIMOTO ◽  
...  
Keyword(s):  
Fine Structure ◽  
Lithium Ion Batteries ◽  
Structure Analysis ◽  
Lithium Ion ◽  
Time Resolved ◽  
X Ray ◽  
Absorption Fine ◽  
Fine Structure Analysis ◽  
X Ray Absorption

scholarly journals Monitoring the Formation and Reactivity of Organometallic Alkane and Fluoroalkane Complexes with Silanes and Xe Using Time-Resolved X-ray Absorption Fine Structure Spectroscopy

2019 ◽  
Vol 141 (29) ◽  
pp. 11471-11480 ◽  
Author(s):  
Stuart A. Bartlett ◽  
Nicholas A. Besley ◽  
Andrew J. Dent ◽  
Sofia Diaz-Moreno ◽  
John Evans ◽  
...  
Keyword(s):  
Fine Structure ◽  
Time Resolved ◽  
X Ray ◽  
Absorption Fine ◽  
X Ray Absorption

3C-, 4H- and 6H-SiC Bulks Studied by Silicon K-Edge X-Ray Absorption

2013 ◽  
Vol 740-742 ◽  
pp. 573-576 ◽  
Author(s):  
Wei Zeng ◽  
Zhe Chuan Feng ◽  
Rui Sheng Zheng ◽  
Ling Yun Jang ◽  
Chee Wei Liu
Keyword(s):  
Electronic Structure ◽  
Fine Structure ◽  
High Resolution ◽  
Synchrotron Radiation ◽  
Angular Dependence ◽  
Comparative Studies ◽  
X Ray ◽  
Absorption Fine ◽  
X Ray Absorption

High-resolution synchrotron radiation X-ray absorption of Si K-edge have been employed to investigate 6H-, 4H- and 3C-SiC. Detailed analyses of the extended x-ray absorption fine structure are taken by using the IFEFFIT program, and significant results on the atomic bonding are obtained from these comparative studies. The x-ray absorption near-edge structures of the Si K-edge are investigated, and the electronic structure of 3C-, 4H- and 6H-SiC are studied. In order to investigate the angular dependence, the x-ray absorption near-edge spectra were operated at 55o and 90o of the angle between the surface and the X-ray direction.

Sign in / Sign up

Export Citation Format

Share Document