Transition radiation in the x-ray region from a low emittance 855 MeV electron beam

1997 ◽  
Author(s):  
H. Backe ◽  
K.-H. Brenzinger ◽  
F. Buskirk ◽  
S. Dambach ◽  
Th. Doerk ◽  
...  
Keyword(s):  
Electron Beam ◽  
Transition Radiation ◽  
X Ray ◽  
Low Emittance

Resonant transition radiation in the X-ray region from a low emittance 855 MeV electron beam

1994 ◽  
Vol 349 (1) ◽  
pp. 87-92 ◽  
Author(s):  
H. Backe ◽  
S. Gampert ◽  
A. Grendel ◽  
H. -J. Hartmann ◽  
W. Lauth ◽  
...  
Keyword(s):  
Electron Beam ◽  
Transition Radiation ◽  
X Ray ◽  
Resonant Transition ◽  
Low Emittance

PRODUCTION OF FEMTOSECOND PULSES AND MICRON BEAM SPOTS FOR HIGH BRIGHTNESS ELECTRON BEAM APPLICATIONS

2007 ◽  
Vol 22 (22) ◽  
pp. 3726-3735
Author(s):  
S. G. ANDERSON ◽  
D. J. GIBSON ◽  
F. V. HARTEMANN ◽  
J. S. JACOB ◽  
A. M. TREMAINE ◽  
...  
Keyword(s):  
Electron Beam ◽  
Electron Beams ◽  
Beam Radiation ◽  
High Brightness ◽  
X Ray ◽  
Inverse Compton Scattering ◽  
Inverse Compton ◽  
Strong Focusing ◽  
Moderate Energy ◽  
Low Emittance

Current and future applications of high brightness electron beams, which include advanced accelerators and beam-radiation interactions require both transverse and longitudinal beam sizes on the order of tens of microns. Ultra-high density beams may be produced at moderate energy (50 MeV) by compression and subsequent strong focusing of low emittance, photoinjector sources. We describe the implementation of this method used at the PLEIADES inverse-Compton scattering (ICS) x-ray source at LLNL in which the photoinjector-generated beam has been compressed to 300 fsec rms duration using the velocity bunching technique and focused to 20 μm rms size using an extremely high gradient, permanent magnet quadrupole focusing system.

scholarly journals Perspectives towards Sub-Ångström Working Regime of the European X-ray Free-Electron Laser with Low-Emittance Electron Beams

2021 ◽  
Vol 11 (22) ◽  
pp. 10768
Author(s):  
Ye Chen ◽  
Frank Brinker ◽  
Winfried Decking ◽  
Matthias Scholz ◽  
Lutz Winkelmann
Keyword(s):  
Electron Beam ◽  
Photon Energy ◽  
Free Electron ◽  
Free Electron Laser ◽  
Electron Beams ◽  
Energy Levels ◽  
Energetic Electron ◽  
X Rays ◽  
X Ray ◽  
Low Emittance

Sub-ångström working regime refers to a working state of free-electron lasers which allows the generation of hard X-rays at a photon wavelength of 1 ångström and below, that is, a photon energy of 12.5 keV and above. It is demonstrated that the accelerators of the European X-ray Free-Electron Laser can provide highly energetic electron beams of up to 17.5 GeV. Along with long variable-gap undulators, the facility offers superior conditions for exploring self-amplified spontaneous emission (SASE) in the sub-ångström regime. However, the overall FEL performance relies quantitatively on achievable electron beam qualities through a kilometers-long accelerator beamline. Low-emittance electron beam production and the associated start-to-end beam physics thus becomes a prerequisite to dig in the potentials of SASE performance towards higher photon energies. In this article, we present the obtained results on electron beam qualities produced with different accelerating gradients of 40 MV/m–56 MV/m at the cathode, as well as the final beam qualities in front of the undulators via start-to-end simulations considering realistic conditions. SASE studies in the sub-ångström regime, using optimized electron beams, are carried out at varied energy levels according to the present state of the facility, that is, a pulsed mode operating with a 10 Hz-repetition 0.65 ms-long bunch train energized to 14 GeV and 17.5 GeV. Millijoule-level SASE intensity is obtained at a photon energy of 25 keV at 14 GeV electron beam energy using a gain length of about 7 m. At 17.5 GeV, half-millijoule lasing is achieved at 40 keV. Lasing at up to 50 keV is demonstrated with pulse energies in the range of a few hundreds and tens of microjoules with existing undulators and currently achievable electron beam qualities.

Spatial beam profiles of femtosecond X-ray pulses generated by laser Compton scattering from a low-emittance electron beam

2003 ◽  
Vol 76 (3) ◽  
pp. 293-297 ◽  
Author(s):  
M. Yorozu ◽  
J. Yang ◽  
Y. Okada ◽  
T. Yanagida ◽  
F. Sakai ◽  
...  
Keyword(s):  
Electron Beam ◽  
Compton Scattering ◽  
X Ray ◽  
Spatial Beam ◽  
Laser Compton Scattering ◽  
Low Emittance

scholarly journals Hard X-ray nanofocusing at low-emittance synchrotron radiation sources

2014 ◽  
Vol 21 (5) ◽  
pp. 996-1005 ◽  
Author(s):  
Christian G. Schroer ◽  
Gerald Falkenberg
Keyword(s):  
Electron Beam ◽  
Synchrotron Radiation ◽  
Storage Ring ◽  
Source Parameters ◽  
Gaussian Model ◽  
Scanning Microscopy ◽  
X Ray ◽  
Radiation Sources ◽  
Central Cone ◽  
Low Emittance

X-ray scanning microscopy relies on intensive nanobeams generated by imaging a highly brilliant synchrotron radiation source onto the sample with a nanofocusing X-ray optic. Here, using a Gaussian model for the central cone of an undulator source, the nanobeam generated by refractive X-ray lenses is modeled in terms of size, flux and coherence. The beam properties are expressed in terms of the emittances of the storage ring and the lateral sizes of the electron beam. Optimal source parameters are calculated to obtain efficient and diffraction-limited nanofocusing. With decreasing emittance, the usable fraction of the beam for diffraction-limited nanofocusing experiments can be increased by more than two orders of magnitude compared with modern storage ring sources. For a diffraction-limited storage ring, nearly the whole beam can be focused, making these sources highly attractive for X-ray scanning microscopy.

scholarly journals Coherence properties of the high-energy fourth-generation X-ray synchrotron sources

2019 ◽  
Vol 26 (6) ◽  
pp. 1851-1862 ◽  
Author(s):  
R. Khubbutdinov ◽  
A. P. Menushenkov ◽  
I. A. Vartanyants
Keyword(s):  
Electron Beam ◽  
Storage Ring ◽  
High Energy ◽  
Storage Rings ◽  
Relative Energy ◽  
Diffraction Limit ◽  
Energy Spread ◽  
Fourth Generation ◽  
X Ray ◽  
Low Emittance

An analysis of the coherence properties of the fourth-generation high-energy storage rings with emittance values of 10 pm rad is performed. It is presently expected that a storage ring with these low emittance values will reach diffraction limit at hard X-rays. Simulations of coherence properties were performed with the XRT software and an analytical approach for different photon energies from 500 eV to 50 keV. It was demonstrated that a minimum photon emittance (diffraction limit) reached at such storage rings is λ/2π. Using mode decomposition it is shown that, for the parameters of the storage ring considered in this work, the diffraction limit will be reached for soft X-ray energies of 500 eV. About ten modes will contribute to the radiation field at 12 keV photon energy and even more modes give a contribution at higher photon energies. Energy spread effects of the electron beam in a low-emittance storage ring were analysed in detail. Simulations were performed at different relative energy spread values from zero to 2 × 10−3. A decrease of the degree of coherence with an increase of the relative energy spread value was observed. This analysis shows that, to reach the diffraction limit for high photon energies, electron beam emittance should go down to 1 pm rad and below.

Sign in / Sign up

Export Citation Format

Share Document