Measurement of soft x‐ray multilayer mirror reflectance at normal incidence using laser‐produced plasmas

1988 ◽  
Vol 52 (4) ◽  
pp. 269-271 ◽  
Author(s):  
J. A. Trail ◽  
R. L. Byer ◽  
T. W. Barbee
1988 ◽  
Vol 102 ◽  
pp. 115-118
Author(s):  
M.E. Bruner ◽  
B.M. Haisch ◽  
W.A. Brown ◽  
L.W. Acton ◽  
J.H. Underwood

AbstractA solar coronal loop system has been photographed in soft X-rays using a normal incidence telescope based on multilayer mirror technology. The telescope consisted of a spherical objective mirror of 4 cm aperture and 1 m focal length, a film cassette, and a focal plane shutter. A metallized thin plastic film filter was used to exclude visible light. The objective mirror was covered with a multilayer coating consisting of alternating layers of tungsten and carbon whose combined thicknesses satisfied the Bragg diffraction condition for 44 Å radiation. The image was recorded during a rocket flight on 1985 October 25, and was dominated by emission lines arising from the Si XII spectrum. The rocket also carried a high resolution soft X-ray spectrograph that confirmed the presence of Si XII line radiation in the source. This image represents the first successful use of multilayer technology for astrophysical observations.


1988 ◽  
Vol 49 (C1) ◽  
pp. C1-115-C1-118 ◽  
Author(s):  
M. E. BRUNER ◽  
B. M. HAISCH ◽  
W. A. BROWN ◽  
L. W. ACTON ◽  
J. H. UNDERWOOD
Keyword(s):  

2020 ◽  
Author(s):  
Kiranjot ◽  
Mangalika Sinha ◽  
R. K. Gupta ◽  
P. K. Yadav ◽  
Mohammed H. Modi

2004 ◽  
Vol 75 (10) ◽  
pp. 4029-4032 ◽  
Author(s):  
B. Jones ◽  
C. Deeney ◽  
A. Pirela ◽  
C. Meyer ◽  
D. Petmecky ◽  
...  
Keyword(s):  
X Ray ◽  

2016 ◽  
Vol 23 (5) ◽  
pp. 1110-1117 ◽  
Author(s):  
M. V. Vitorino ◽  
Y. Fuchs ◽  
T. Dane ◽  
M. S. Rodrigues ◽  
M. Rosenthal ◽  
...  

A compact high-speed X-ray atomic force microscope has been developed forin situuse in normal-incidence X-ray experiments on synchrotron beamlines, allowing for simultaneous characterization of samples in direct space with nanometric lateral resolution while employing nanofocused X-ray beams. In the present work the instrument is used to observe radiation damage effects produced by an intense X-ray nanobeam on a semiconducting organic thin film. The formation of micrometric holes induced by the beam occurring on a timescale of seconds is characterized.


2000 ◽  
Vol 453 (1-3) ◽  
pp. 183-190 ◽  
Author(s):  
G.J. Jackson ◽  
S.M. Driver ◽  
D.P. Woodruff ◽  
B.C.C. Cowie ◽  
R.G. Jones

1989 ◽  
Vol 1 (2) ◽  
pp. 190-206
Author(s):  
David L. Shealy ◽  
David R. Gabardi ◽  
Richard B. Hoover ◽  
Arthur B. C. Walker Jr. ◽  
Joakim F. Lindblom ◽  
...  
Keyword(s):  

2001 ◽  
Vol 72 (1) ◽  
pp. 1183-1187 ◽  
Author(s):  
S. Duorah ◽  
A. Ejiri ◽  
S. Lee ◽  
H. Iguchi ◽  
A. Fujisawa ◽  
...  

Nanoscale ◽  
2018 ◽  
Vol 10 (5) ◽  
pp. 2226-2230 ◽  
Author(s):  
Matthias Meier ◽  
Zdeněk Jakub ◽  
Jan Balajka ◽  
Jan Hulva ◽  
Roland Bliem ◽  
...  

Benchmarking DFT calculations against precise normal incidence X-ray standing wave measurements.


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